This interactive workshop covers topics for compliance to ISO 17025, ANSI Z 540.3, and auditing techniques. 40 Elearning hours are provided as a prerequisite for attendee and staff unable to attend. The workshop's target audience is the laboratory managers and metrology technicians, but the content is useful for the consumers of calibration and test services in assessing and qualifying their calibration and test providers..
Introduction and Assessment Audit to the Requirements of ISO/IEC 17025:2005 and ANSI Z540.3
This section covers the details and interpretations of the requirements of the standard as it is applied to calibration and test laboratories. It explains how to plan, organize, conduct and report the results of an assessment. The attendee shall understand the conduct and activities required in order to perform an internal assessment of their own laboratory or an external assessment of their supplier's laboratory to the requirements of the ISO 17025/ANSI Z540.3 standard. A purchasing template is provided. The Management and Technical requirements of ISO 17025:2005 are thoroughly covered (including ANSI Z540.1 and the new ANSI Z540.3 differences). The topics covered help the attendee become familiar with the standards.. Additional best practices based on the workshop instructor's knowledge and experience are shared.
Uncertainty Management
This section covers specifications, resoultion, tolerances, accuracy, uncertainty ratios, and guard banding. Attendees gain a clear understanding on how to read and interpret published specifications, to calculate and interpret Measurement Uncertainty, uncertainty ratios and guard banding for 17025 compliance.
Interval and Risk Analysis
An introduction to Interval and Risk analysis is covered and how it should be applied with respect to ANSI Z540.3 compliance. This section also covers information on how to maintain confidence in the calibration and testing process, including interpretation of proficiency testing data and results. Statistical Process Control (SPC) and other quality analysis techniques are introduced to assist the attendees in analyzing a Laboratory Quality Control data for decision making.
The workshop is conducted by Dilip Shah – WorkPlace Training Inc., Chief Subject Matter Expert
Dilip Shah (ASQ Senior Member) has more than 30 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He is well versed in all measurement parameters. He has been employed in various positions with Phillips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies.
Dilip is certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician. Dilip volunteers his time with the local Akron-Canton (Ohio) ASQ section where he was the past chairman (2001-2002). Dilip has been a member of the advisory board of the University of Akron Engineering and Science Technology Division since 1988. Dilip also belongs to the Statistics, Automotive, Inspection, Quality Audit and Measurement Quality Divisions (Chair 2007-2008, 2003-2005 years) of American Society for Quality. Dilip is the co-author of The Metrology Handbook published by the ASQ Quality Press. Dilip participated in the development of ASQ's Certified Calibration Technician exam. Dilip participates actively in the measurement and education related issues through NCSLI (National Conference of Standards Laboratories International) and the west coast based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip also is a member of IEEE (Institute of Electrical and Electronic Engineers). Dilip is the recipient of MQD's 2005 Max J. Unis Award and co-recipient of 2003 MSC's Algie Lance Award for the best Paper (Gage R.& R versus ANOVA). Dilip is also serving a 3-year term on the A2LA Board of Directors (2006-2009).
June 9-13, 2008
ASQ CCT Primer & Exam
$1695. per person, Group rates available
ASQ certifications have had a history of recognition for over 35 years and they are recognized and endorsed internationally by major corporations. The ASQ Certified Calibration Technician Exam was first offered in 2003 and shall approach its fifth anniversary in 2008 with over 800 candidates passing the exam.
Workplace Training is pleased to offer the ASQ Certified Calibration Technician Exam refresher workshop in Boulder, Colorado. The workshop shall be conducted from June 9-12, 2008. On June 13, 2008, ASQ shall administer the CCT Exam at NCSLI Training Center in Boulder, Colorado. The refresher workshop shall prepare the CCT candidate for a final practice round of sample exam questions, exam taking techniques and address any other questions and concerns. Sample exam questions covering the CCT Body of Knowledge shall be covered. ELEARNING is provided as a prerequisite for attendee.
Note:
• The prospective candidate has to apply directly to ASQ and pay separately for taking the exam. There is an application deadline for taking the test.
• There are pre-requisites for taking the exam.
• The exam will begin at 8:00 AM Friday and lasts for 4 hours without any breaks.
• Workplace Training does not administer the CCT exam.
• ASQ administers the actual exam in Boulder.
• For more information on the application process, please visit: http://www.asq.org/certification/apply.html
• Please bring a non programmable calculator to the workshop.
The workshop is conducted by:
Dilip A. Shah (ASQ Senior Member) has over 30 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He is well versed in all measurement parameters. He has been employed in various positions with Phillips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies. He is currently a Principal of E = mc3 Solutions, a consulting practice that provides training and consulting solutions in ISO9000/TS 16949, ISO17025, measurement and computer applications.
Dilip is certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician. Dilip volunteers his time with the local Akron-Canton (Ohio) ASQ section where he was the Chair (2001-2002 year). Dilip has been a member of the advisory board of the University of Akron Engineering and Science Technology Division since 1988. Dilip also belongs to the Statistics, Automotive, Inspection, Quality Audit and Measurement Quality Divisions (Chair 2007-2008, 2003-2005 years) of American Society for Quality. Dilip is the co-author of The Metrology Handbook published by the ASQ Quality Press. Dilip participated in the development of ASQ's Certified Calibration Technician exam. Dilip participates actively in the measurement related issues through National Conference of Standards Laboratories International (NCSLI) and the west coast based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip also is a member of Institute of Electrical and Electronic Engineers (IEEE). Dilip is the recipient of MQD's Highest Award, the 2005 Max J. Unis Award and co-recipient of MSC's 2003 Algie Lance Award for the Best Paper (Gage R. & R. versus ANOVA). Dilip is a Member of the A2LA Board of Directors (2006-2009). Dilip is a Chief Technical Officer for Workplace Training Inc. which provides many on-line measurement-related training options to the industry. Dilip is also involved in Education & Training Committee activities of NCSLI
June 16-18, 2008
Measurement Uncertainty
$1495.per person, Group rates available
ISO 17025 requires that measurement uncertainties of the various parameters in the calibration and testing process be quantified in order for the calibration/tests to be traceable and valid. This workshop covers the necessary topics required by the ISO 17025 standard for compliance. Workshop participants gain hands-on experience on quantifying measurement uncertainty which can be applied in any testing and calibration application. ELEARNING is included as a prerequisite for attendee and staff unable to attend.
The workshop is designed for technicians, engineers, metrologists, quality/laboratory managers and other personnel who want to understand the concept of applying and managing Measurement Uncertainty data. The workshop content is arranged in a basic, building-block format so that participants can understand and implement all aspects of Measurement Uncertainty. Timely, hands-on Measurement Uncertainty examples are given during the workshop to provide familiarity and experience.
Topics Covered
Standards and Practices Definitions and Basic Concepts
Basic Statistics Uncertainty Distributions
Uncertainty Calculations Combining Uncertainty Methods
Determining Expanded Uncertainty Analyzing and Reporting Uncertainty
Applying Uncertainty Data Special Topics (T.A.R. vs. T.U.R. etc.)
Analyzing and understanding Calibration Reports Decision Rules
New ISO 17025:2005 data analysis requirements explained!
The workshop is conducted by:
Dilip A. Shah (ASQ Senior Member) has over 30 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He is well versed in all measurement parameters. He has been employed in various positions with Phillips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies. He is currently a Principal of E = mc3 Solutions, a consulting practice that provides training and consulting solutions in ISO9000/TS 16949, ISO17025, measurement and computer applications.
Dilip is certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician. Dilip volunteers his time with the local Akron-Canton (Ohio) ASQ section where he was the Chair (2001-2002 year). Dilip has been a member of the advisory board of the University of Akron Engineering and Science Technology Division since 1988. Dilip also belongs to the Statistics, Automotive, Inspection, Quality Audit and Measurement Quality Divisions (Chair 2007-2008, 2003-2005 years) of American Society for Quality. Dilip is the co-author of The Metrology Handbook published by the ASQ Quality Press. Dilip participated in the development of ASQ's Certified Calibration Technician exam. Dilip participates actively in the measurement related issues through National Conference of Standards Laboratories International (NCSLI) and the west coast based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip also is a member of Institute of Electrical and Electronic Engineers (IEEE). Dilip is the recipient of MQD's Highest Award, the 2005 Max J. Unis Award and co-recipient of MSC's 2003 Algie Lance Award for the Best Paper (Gage R. & R. versus ANOVA). Dilip is a Member of the A2LA Board of Directors (2006-2009). Dilip is a Chief Technical Officer for Workplace Training Inc. which provides many on-line measurement-related training options to the industry. Dilip is also involved in Education & Training Committee activities of NCSLI
Oct 6 - 7, 2008
SPC for Calibration and Testing Laboratories
$1295. per person, group and gov discounts
Statistical Process Control (SPC) using control chart methods is normally thought of as manufacturing and process oriented statistical analysis tools. So, why utilize them in testing and calibration laboratory applications? They are used in many indirect ways in testing and calibration environment even when laboratory personnel do not think they are using them. When one checks their standards at a regular interval, performs intermediate checks and record the data, they are informally performing the first half function of control charts.
This workshop formalizes that approach, so useful information such as measurement uncertainty is derived from the data gathering exercise. Typical applications of control charts extend to:
Check Standards, Stability Studies, Characterizing Drift, Long Term Reproducibility
Determining Realistic Tolerances, Determining Measurement Uncertainties
Timely, hands-on examples and practical applications are demonstrated during the workshop to provide familiarity and experience. Knowledge of basic math is required but no other prior experience is necessary.
Topics Covered
Mean, Mode, Median, Range Types of Control Charts
Population and Sample Standard Deviation Decision rules for interpreting Control Chart data
Standard Deviation of the Mean SPC Applications in Calibration & Testing
Histogram, Bell Curve, Central Limit Theorem Process Capability and determining risks
z, t and F distributions Gage R & R and ANOVA techniques
Measurement Uncertainty from SPC Using spreadsheets for SPC
ISO 17025 requires that measurement uncertainties of the various parameters in the calibration and testing process be quantified in order for the calibration/tests to be traceable and valid. This workshop covers the necessary topics required by the ISO 17025 standard for compliance. Workshop participants gain hands-on experience on quantifying measurement uncertainty which can be applied in any testing and calibration application. ELEARNING is included as a prerequisite for attendee.
The workshop is designed for technicians, engineers, metrologists, quality/laboratory managers and other personnel who want to understand the concept of applying and managing Measurement Uncertainty data. The workshop content is arranged in a basic, building-block format so that participants can understand and implement all aspects of Measurement Uncertainty. Timely, hands-on Measurement Uncertainty examples are given during the workshop to provide familiarity and experience.
Topics Covered
Standards and Practices Definitions and Basic Concepts
Basic Statistics Uncertainty Distributions
Uncertainty Calculations Combining Uncertainty Methods
Determining Expanded Uncertainty Analyzing and Reporting Uncertainty
Applying Uncertainty Data Special Topics (T.A.R. vs. T.U.R. etc.)
Analyzing and understanding Calibration Reports Decision Rules
New ISO 17025:2005 data analysis requirements explained!
The workshop is conducted by:
Dilip A. Shah (ASQ Senior Member) has over 30 years of industry experience in metrology, electronics, instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. He is well versed in all measurement parameters. He has been employed in various positions with Phillips Electronics (UK), Kodak Ltd. (UK), Instruments Division of Monsanto Corporation, Flexsys America and Alpha Technologies. He is currently a Principal of E = mc3 Solutions, a consulting practice that provides training and consulting solutions in ISO9000/TS 16949, ISO17025, measurement and computer applications.
Dilip is certified by American Society for Quality (ASQ) as a Certified Quality Auditor, Certified Quality Engineer and Certified Calibration Technician. Dilip volunteers his time with the local Akron-Canton (Ohio) ASQ section where he was the Chair (2001-2002 year). Dilip has been a member of the advisory board of the University of Akron Engineering and Science Technology Division since 1988. Dilip also belongs to the Statistics, Automotive, Inspection, Quality Audit and Measurement Quality Divisions (Chair 2007-2008, 2003-2005 years) of American Society for Quality. Dilip is the co-author of The Metrology Handbook published by the ASQ Quality Press. Dilip participated in the development of ASQ’s Certified Calibration Technician exam. Dilip participates actively in the measurement related issues through National Conference of Standards Laboratories International (NCSLI) and the west coast based Measurement Science Conference (MSC) where he presents sessions, papers and workshops. Dilip also is a member of Institute of Electrical and Electronic Engineers (IEEE). Dilip is the recipient of MQD’s Highest Award, the 2005 Max J. Unis Award and co-recipient of MSC’s 2003 Algie Lance Award for the Best Paper (Gage R. & R. versus ANOVA). Dilip is a Member of the A2LA Board of Directors (2006-2009). Dilip is a Chief Technical Officer for Workplace Training Inc. which provides many on-line measurement-related training options to the industry. Dilip is also involved in Education & Training Committee activities of NCSLI.
