Topic: NCSL International Board News and 2017 Workshop & Symposium updates
Speaker: Paul Packebush, National Instruments Corporation
Topic: Taking the Ohm from the SI to the Workbench to Benefit Industry
Speaker: Jack Somppi, Measurements International
Abstract: Metrology’s needs for resistance standards are strong and must support both measuring and realizing the ohm. Filling this need is key across many industries, areas of science, and a wide range of governmental services. It is not unusual to see measurement requirements range from one micro ohm up, through low, moderate and high levels, into the Peta ohms in value. And in doing so, the associated measurement uncertainties range from multiple units of percent and improving to levels of 10 × 10-9. Today’s metrology lab has a task of doing these challenging measurements while having a strong traceability to the SI. This presentation reviews the standards, instrumentation, and measurement techniques that support resistance through ranges of more than 20 orders of magnitude with the best possible traceable measurement uncertainties. The presentation will include an overview of metrology equipment ranging from the intrinsic standard for resistance, through primary to secondary and working standards. Also the instrumentation needed for reliable measurements and comparisons are presented with instruction on key considerations and concerns for their best use.
Topic: US Government Officially Recognizes Calibration Occupations.
Speaker: Chris Grachanen, Hewlett-Packard Enterprise
Abstract: An important Day in Metrology occurred on July 22, 2016, the US Government (US Dept. of Labor) officially recognized Calibration Occupation. This effort was spearheaded by ASQ Measurement Quality Division and NCSL International for the last 20 years under the relentless efforts of Christopher Grachanen and many others. The fruits of their labor are paying off. This means metrology professionals will no longer be classified as “meter checker” and other absurd descriptions when they get hired. HR Departments in your company will be able to classify you under the special description befitting the calibration professional.
Topic: Proper Use and Care of Precision Hand Tools
Abstract: Precision Hand Tools are everywhere…and proper care and use of these instruments is often overlooked.
Topic: Low Level Resistance Measurement Fundamentals Challenges & Insights
Speaker: Mike Sciulli, Tegam, Inc.
Abstract: Today there are several applications where making a low resistance measurement is required, such as; bonding, component testing, ground testing, cabling (harness manufacturing), PCB trace testing, coil resistance testing, thermo-electric devices, etc... The challenges in making such measurements require selecting the right type of micro-ohmmeter along with the correct probes.
The presentation will review the different types of micro-ohmmeters and which is best for what applications. There will be different micro-ohmmeters on hand that will be used to demonstrate what works best for certain applications and why. Some micro-ohmmeters provide the capability to adjust certain levels of test current and or open circuit voltage. This capability is an important when testing thermo-electric devices and or when a dry circuit test is required. Of course the instrument can only measure what is properly connected. When dealing with Kelvin Probes this is not always easy, especially with everything getting smaller. A full set of probes from the standard Kelvin Clip to the Push Pin to the new Coaxial Probe will be utilized in making the connections during the presentation. Utilizing the correct probe is critical to making good micro-ohm measurements.