South Central US Region -
Central Texas Section (1321)

Central Texas Section Coordinator

Full NameOrganizationMailing AddressWork PhoneEmail
Jorge MartinsNational Instruments Corporation11500 North Mopac Expressway Austin, TX 78759-3504 UNITED STATES(425) 501-5212jmartins@ni.com
Upcoming Meetings and Events>
NCSLI Central Texas Section Meeting
Friday, May 4, 2018

Please join Us!
Meeting Overview:
The theme of the meeting is “Innovation and Automation in Calibration.” A number of presentations will be given ranging from 5G networks metrology to ISO/IEC 17025 challenges. 
 
Guided visit to Transcat laboratories in Houston.
 

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Meeting Contact:
Jorge Martins
11500 N. Mopac Expwy.
Building C
Austin, TX 78759-3504
jmartins@ni.com
 
Meeting Host / Meeting Location:
Christopher L. Grachanen - Transcat

Courtyard by Marriott I-10 West/Energy Corridor
12401 Katy Freeway
Houston, TX  77079
Office: 281-496-9090 ext. 608
 
Google Maps

Meeting Date:
Friday May 4, 2018

Meeting Time:
8:00 AM to 3:00 PM

Meeting Cost:
    NCSL International
Complimentary Training

Meeting Sponsor:
Transcat, Inc – Sponsoring venue, lunch and refreshments

Meeting Speakers:

Topic: An Updated Methodology for Scale and Balance Calibrations
Speaker:
Ken Kolb, Transcat, Inc.

Abstract:
This presentation details a revision to the methodology used by Transcat for the calibration of scales and balances. In particular, a 'substitution' method is now used to evaluate nonlinearity. This method eliminates a characteristic of the former 'direct' method that frequently resulted in very low or upside-down TURs. Other enhancements in the revised method also contribute to a better estimation of the overall balance uncertainty. The overall uncertainty (often thought of as accuracy) is useful in direct weighing applications, especially when the OEM specifications state subcomponent performance ratings (linearity, repeatability, eccentricity, etc.) but not the overall accuracy. The substitution linearity method could also be applied to other measurement systems where physical artifacts can be used. For example, a relatively short end measuring rod could be used to incrementally characterize the nonlinearity of a long length measuring apparatus and provide an uncertainty typically much smaller than achievable using assortment length end rods.

Learning Objectives: 

  1. Learn a revised methodology for the calibration of scales and balances.
  2. Understanding a new 'substitution' method used to evaluate nonlinearity
  3. Enhancements in the revised method that contribute to a better estimation of the overall balance uncertainty


Topic: The Metrology of High Frequency Signal Integrity
Speaker:
 Chris Grachanen, Transcat, Inc.

Abstract: 
The fifth generation (5G) of mobile communication networks is one of the upcoming communication schemes which requires advance hardware technologies to support higher data rates, lower network latencies, better energy efficiencies and reliable connectivity. These hardware technologies are restrained by the passive interconnections between integrated circuits which are susceptible to impediments such as transmission loss, return loss due to complex impedance mismatches, signal risetime adulteration, channel to channel timing skews and cross-talk interference. The validation of interconnection performance employs a variety of time and frequency domain based test equipment and associated testing methodologies operating in the tens of gigahertz. This presentation will explore the metrology behind high frequency interconnection measurements. So, hold on to your pocket protector, it’s going to get technical.

Learning Objectives:

  1. What is the fifth generation (5G) of mobile communication networks
  2. Metrology behind high frequency interconnection measurements

 
Topic: Innovations in Precision Voltage Dividers
Speaker:
 Tim Stark, Guildline Instruments Limited

Abstract: 
Voltage dividers are commonly used with Electronic Voltage References, typically 10 V or 1 V, to calibrate voltage references, voltage meters, and voltage sources.  One application is to divide down the reference voltage to create very accurate lower voltages (e.g. from 1 V to 1 mV via 1:10, 1:100 and 1:1000 ratios).  Another use of voltage dividers is to allow comparison from a secondary voltage source to an Electronic Voltage Reference by reducing the secondary’s voltage level to that of the Electronic Voltage Reference.  This presentation will show the progression of voltage dividers from the early 1950’s through the variations available today.  Different designs will be presented for voltage dividers, along with a description of manufacturing issues and operational challenges.  For example, today the lowest uncertainty voltage dividers require a lengthy calibration process before use and typically can meet their best uncertainties for only an 8-hour operational period.  The calibration and operational process is either 100% manual or requires very expensive and complex standards as well as time-consuming and complicated procedures. The presentation will provide insight into newly developed and patent pending technology/designs that overcome many of the issues that have plagued the limitations of precision voltage dividers as well as solutions to operational, and automation of these standards.

Learning Objectives:

  1. Understand the use of high precision voltage dividers
  2. Progression of voltage dividers from the early 1950’s through the variations available today
  3. How to overcome the limitations of precision voltage dividers and solutions to automate these measurements

 
Topic: Balancing Cost Savings and ISO/IEC 17025
Speaker:
Gary Bennett, National Instruments Corporation

Abstract:
How does standardizing contract review help and hinder a calibration laboratory? As a Metrology Laboratory Manager, I want the variations of the laboratory processes to be at a minimum. In our laboratory we want one way to calibrate each item that we support. The efficiencies we’ve developed are lost when a customer wants something different than what we normally provide. On the other hand, when I send one our standards out for calibration, I want it calibrated exactly how I tell that provider I want it calibrated. I don’t care that it’s not the way they normally do that particular item. I’m the customer and ISO/IEC 17025 talks a lot about meeting the customers’ requirements. Everything that I send out for calibration I want done the same as last time. With every variation, something has to give, and efficiency is reduced. I am willing to pay more for the variation I demand from another calibration laboratory, but I report to people within my organization that require cost savings. Variation and cost savings are almost always mutually exclusive; unless I charge a lot more for the variation to allow for the variation to happen. During this presentation you’ll see some examples of how we have worked with our calibration providers to achieve the calibrations we needed.

Learning Objectives:

  1. Understand contract review requirements if ISO/IEC 17025
  2. Understand what to ask for when requesting a calibration
  3. Understand you can't just say "I want this calibrated." anymore. Every calibration laboratory can perform a calibration differently. Even the same laboratory can provide a different calibration on the same item.
     

Topic: TBD
Speaker:  
David A. Patterson, Fluke Calibration

Meeting Schedule:
8:00AM         

9:00AM      
 
Meeting Registration and breakfast provided by Transcat

9:00AM

9:10AM

Welcome and introduction – Jorge Martins, National Instruments Corporation

9:10AM

10:00AM

An Updated Methodology for Scale and Balance Calibrations, Ken Kolb, Transcat

10:00AM

10:45AM

Balancing Cost Savings and ISO/IEC 17025, Gary Bennett, National Instruments

10:45AM

11:30AM

The Metrology of High Frequency Signal Integrity, Chris Grachanen, Transcat

11:30AM

12:30PM

Lunch provided by Transcat

12:30PM

13:45PM

Innovations in Precision Voltage Dividers, Tim Stark, Guildline Instruments Limited

1:45PM

2:30PM

TBD, David A. Patterson, Fluke Calibration

2:30PM

3:00PM

Door prizes and closing remarks, Jorge Martins, National Instruments Corporation

3:00PM

Visit Transcat Laboratory in Houston



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NCSLI Local Region Meeting Survey
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