Topic: Measuring temperature and salinity in the deep ocean - how instrument calibrations can ruin your data, or improve your calibration system.
Speaker: Dr. Fritz Stahr, Oceanographer and Manager of the Seaglider Fabrication Center, University of Washington
Abstract: Deep ocean water properties are infrequently measured but play a crucial role in understanding the global climate. To expand our observational capacity, we developed an autonomous underwater vehicle (AUV), Deepglider, that carries temperature, conductivity, pressure, and dissolved oxygen instruments from the surface to 6000 meters deep. While testing the first prototypes of this vehicle in 2015, we discovered anomalies in temperature and salinity data which led us to suspect poor accuracy and repeatability in calibration procedures. This presentation will cover the story of how some parts of the environment not only demand better metrology, but sometimes help create it.
Biography: Dr. Stahr received a BS in mechanical engineering from Stanford University in 1981, and a PhD in oceanography from the University of Washington (UW) in 1998. After earning a bachelor’s degree, he went directly to industry, and spent 10 years with two different instrument companies (ophthalmic instruments and solid-state lasers) before returning to academia to pursue a PhD in physical oceanography at UW.
Topic: Systems-of-Systems Metrology software-Metrology.NET®
Speaker: Michael Schwartz, Cal Lab Solutions
Abstract: Software running on a single computer or platform is a thing of the past. Today’s metrology software needs to be scalable, flexible, and dynamic. It must be designed to integrate with enterprise business systems, taking full advantage of distributed computing and service oriented protocols.
Know what a REST Call is and how it can be used in Metrology.NET®
Know the meaning of METADATA
Understand the block breakdown of metrology automation
How standardized systems solves business problems
Biography: Mr. Schwartz completed training at Lowry AFB in 1989 and was honorably discharged after 11 years of serving in the US Army. He graduated from the University of Maryland with a degree in Business Management and a minor in Computer Science. Mr. Schwartz spent two years writing compliance testing software and database applications while stationed at White Sands Missile Range in NM. After leaving the military, he wrote automation software for five years before starting his own automation engineering company in the Denver Metro area. Since 2003, Cal Lab Solutions has provided automation solutions to calibration labs around the world, supporting Fluke MET/CAL®, Edison MUDCATS. In 2004, Cal Lab Solutions debuted PS-CAL, a stand-alone, drop-in replacement to HP11760S; SAM (Specialized Applications for Metrology; and most recently, Metrology.NET®.
Topic: Measurement Decision Risk and Decision Rules in the new ISO/IEC 17025
Speaker: Jeff Gust, Fluke Corporation
Abstract: The present version of ISO 17025 is very vague about addressing measurement decision risk when making statements of compliance (e.g. in or out of tolerance). Because of this, ANSI/NCSL Z540.3 created very stringent requirements, specifying a 2% false accept risk and/or require a 4:1 TUR. This issue has been addressed in the latest draft of ISO/IEC 17025 and will be discussed in detail. Additionally the presentation will provide advice on how to comply with the proposed requirements.
Clarify the present requirements of ISO/IEC 17025 and ANSI/NCSL Z540.3 for measurement decision risk
Communicate the requirements of Draft International Standard (DIS) ISO/IEC 17025 for measurement decision risk
Provide examples on how to comply with the DIS
Biography: Jeff Gust is the Chief Corporate Metrologist for Fluke Calibration. He is a past President of NCSLI and a recipient of the Measurement Science Conference Woodington award.
Topic: New Developments in the Quantum Hall Resistance Standard (An Intrinsic Standard for the Ohm)
Speaker: Jack Somppi, Measurements International
Abstract: This presentation discusses the improvements in the Quantum Hall Resistance System. The QHR system consisted of three main parts: cryogenics, QHR sample and the measurement bridge. First developed in late 1990s improvements were made to all areas including the sample, the technique for changing the samples, automation, power line protection and the measurement bridge technology. The latest technology combines the improvements with the capability for the system to collect and re-liquefy the helium gas that boils off for a very minimal loss of helium. Improvements to the measurement technology were required for measuring Vxy on contacts 1 & 2 and 3 & 4 on the 1 = 2 plateau using a new room temperature direct current comparator ratio measurement bridge known as the Accubridge® 6020Q to lower the measurement uncertainty in the range of 0.005 ppm or less. The QHR System verification is referenced to the Institute for National Measurement Standards (INMS) at the National Research Council (NRC), Canada and METAS in Switzerland.
Review the advantages and disadvantages of the MI QHR system through an evolution of 4 generations
Examine the improvements possible with automation
Examine improvements for establishing RK90/2 using an improved room temperature bridge
Present implementation plans for liquid free usage
Biography: Jack Somppi is VP of Business Development at Measurements International. His responsibilities include business development for the company worldwide. Jack holds both Bachelor of Science and Master of Science degrees in electrical engineering from Montana State University. Jack is active in NCSL International as MI’s Member delegate. He presently serves on the Board of Directors and is Vice President of Marketing. In 2015, he joined MI as VP of Business developments. Prior to that Jack worked in Fluke Calibration since 1976.
Jack and his wife Vicki live in Bothell, Washington. Outside activities include both church and community service. Jack is a Vice President of the Mt. Baker Council of the Boy Scouts of America. Jack’s hobbies include working on his 1960 vintage sports car, photography, as well as working with personal computers.
Topic: Highly Elastic Strain Gage for Low Modulus Materials
Author: Anthony Piazza, NASA Armstrong
Speaker: Andrew Hickson, The Boeing Company
Abstract: This presentation is about strain measurements on highly elastic materials possessing low Young’s modulus and high yield strain. The learning objective is how to adapt current Plethysmography liquid metal strain gage technology for aerostructures.
Topic: Josephson Voltage Metrology for Watt Balance Experiment at NIST
Speaker: Yi-hua Tang, National Institute of Standards and Technology (NIST)
Abstract: Planck constant, h is one of the seven fundamental constants proposed to redefine the SI. It has been measured by the watt balance experiment since the 1980s. In its early days, the watt balance experiment played a vital role in determining the Josephson constant KJ-90 which was adopted internationally on January 1, 1990. The development of Josephson technologies, especially the implementation of Programmable Josephson Voltage Standard (PJVS) in voltage metrology has greatly improved the uncertainty of voltage measurement in the watt balance by more than an order of magnitude. The intertwined interaction between voltage measurement technology and the watt balance plays an important role in the proposed SI redefinition based on a set of fundamental constants. This talk will present a brief history from the original NIST watt balance in 1980s up to the most recent development of NIST-4 watt balance and the impact that this experiment has had on the voltage metrology.