Poster Presentations
August 28 - 29, 2018

POSTER SESSION 1
Tuesday, August 28, 2018 | 12:15 PM - 1:00 PM


Arbitrary Power Waveforms Measurement for Electrosurgical Unit Analyzers
Dr. Steven Yang, Standards and Calibration Laboratory, The Government of Hong Kong, Special Administrative Region

Metrology after Mercury
Dawn Cross, National Institute of Standards and Technology (NIST)

True Logistical Control: Leveraging a Cost Savings Shared Inventory System to Logistical Control of Drones
Cory Peters, Exelon PowerLabs

Proposal of a Table of Content of Training in Metrology with the Objective of an International Homologation
Julio Jimenez, UPSRJ

Automation Design of Multiple Intelligent Integration System
Dr. Nghiem Nguyen, Raytheon Space and Airborne System
 
Uncertainty Analysis for AC-DC Difference Measurements with the AC Josephson Voltage Standard
Jason Underwood, PhD. Quantum Measurement Division, National Institute of Standards and Technology (NIST)


The Design and Implementation of a Managed ISO/IEC 17025 Quality System
Michael Bailey, Transmille Ltd.

Metrological Parameterization of a High Temperature Oven using LabView at INM Colombia
Wilmar Andres Montano Rodriguez, Instituto Nacional de Metrologia de Colombia