Technical Program
Oral Presentations

SESSION 1
Tuesday, August 15, 2017 | 10:30 AM - 11:30 AM

1A – Metrology Education
Topic: Metrology Integration in University Courses | Abstracts
Room: Chesapeake DEF

A Framework for Training Classes for Dimensional Measurement Incorporating
3D Printing Artifacts
Dr. Joseph Fuehne, Purdue University

Best Lessons Learned from FDA Warning Letters 2017
Walter Nowocin, Medtronic


1B – Cutting Edge Metrology

Topic: The New SI: Looking Into the Future | Abstracts
Room: Chesapeake GHI

Addressing the Need for Wider Access to the SI Unit of Mass Following the Revision of the International System of Units
Dr. Stuart Davidson, National Physical Laboratory (NPL)

Accurate and Not So Accurate Mass Metrology: How Redefining the Kilogram Makes Metrology Better
Georgette Macdonald, National Research Council of Canada (NRC)

1C – Electrical Measurements
Topic: Voltage | Abstracts
Room: Chesapeake JKL

Use of the Binary Voltage Divider for Traceably Verifying DC Voltage Linearity on 8.5 Digit Calibrators and DMMs
Mr. Duane Brown, Measurements International Ltd.

Experiments to Extend the Retrace Specification of Fluke Zener Reference Standards
Mr. Jeff Gust, Fluke Calibration

1D – Mechanical Measurements
Topic: Dimensional | Abstracts
Room: Chesapeake BC

A Submicron Automated Precision Line Scale Calibration System Developed at the Standards and Calibration Laboratory (SCL)
Mr. Steven Yang, Standards and Calibration Laboratory, The Government of Hong Kong

Accuracy and Uncertainty Characterization of the New NIST High Accuracy 1D Laser-Based Micrometer
Mr. John Stoup, National Institute of Standards and Technology (NIST)

SESSION 2

Tuesday, August 15, 2017 | 1:00 PM – 2:00 PM

2A – Metrology Education
Topic: Metrology Outreach | Abstracts
Room: Chesapeake DEF
Panel: Best Practices and Lessons Learned on University Outreach
 
Panelists: Salvador Echeverria, Centro Nacional de Metrología (CENAM); Joe Fuehne, Purdue University College of Technology; Georgia Harris, National Institute of Standards and Technology (NIST); Claudia Santo, Laboratorio Tecnológico Del Uruguay (LATU)

 
2B – Mechanical Measurements
Topic: Pressure | Abstracts
Room: Chesapeake GHI

Analysis of a Quantum Based Refractometer to Replace Mercury Manometers as the Primary Standard for the United States
Mr. Jacob Ricker, National Institute of Standards and Technology (NIST)

A New Semi-Automated System for the Determination of Effective Area of Ruska/Fluke Calibration 246X Piston-Cylinders
Mr. Michael Bair, Fluke Calibration

2C – Thermodynamic

Topic: Temperature | Abstracts
Room: Chesapeake JKL

Microwave Thermal Analysis and Calibration for Additive Manufacturing
Dr. Ryan Murphy, Sandia National Laboratories

Intermediate Checks of Thermometry Fixed-Points
Mr. Douglas Gee, National Research Council Canada (NRC)

2D – Cutting Edge Metrology
Topic: The New SI: What's Next | Abstracts
Room: Chesapeake BC

Quantum Based Redefinition of the Pascal for Primary Pressure Standards and Measurements
Mr. Jay Hendricks, National Institute of Standards and Technology (NIST)

The Next Generation of Metrology – Quantum SI
Mr. Gregory Strouse, National Institute of Standards and Technology (NIST)

SESSION 3
Tuesday, August 15, 2017 | 2:30 PM - 4:00 PM


3A – Metrology Education
Topic: STEM Outreach | Abstracts
Room: Chesapeake DEF

Engineering for Teachers: A Case Study of Professional Development for K-12 STEM Teachers
Hy Tran PhD, Sandia National Laboratories

STEM and Metrology Education Outreach in New Hampshire
Mr. William Hinton, Hinton Technical Services, LLC

A New, Gateway Class Emphasizing Metrology
Dr. Joseph Fuehne, Purdue University

3B – Mechanical Measurements
Topic: Force | Abstracts

Room: Chesapeake GHI

Refurbishing the NIST 4.45 MN Deadweight Force Standard Machine
Mr. Rick Seifarth, National Institute of Standards and Technology (NIST)

Development of Capabilities for Realization and Dissemination of SI-Traceable Dynamic Force
Mr. Akobuije Chijioke, National Institute of Standards and Technology (NIST)

A Fabry-Pérot Optical Cavity as Nanonewton Force Calibration from Photon Momentum
Dr. Ryan Wagner, National Institute of Standards and Technology (NIST)

3C – Electrical Measurements
Topic: Current | Abstracts
Room: Chesapeake JKL

The Enhanced Performance of the DCC Current Comparator using
AccuBridge™ Technology

Duane Brown, Measurements International Ltd.

Ultrastable Low-noise Current Amplifier – A New Tool for Small Current Metrology
Dr. Hansjöerg Scherer, Physikalisch-Technische Bundesanstalt (PTB)

From Counting Electrons to Calibrating Ammeters: Improved Methodologies for 
Traceable Measurements of Small Electric Currents 
Dr. Stephen Giblin, National Physical Laboratory (NPL)

3D – Quality Systems and Management
Topic: Maintaining Laboratory Quality | Abstracts
Room: Chesapeake BC

Using Analytics to Optimize M&TE Inventory: A Case Study
Mr. Dean S. Williams, Duke Energy

Increased Out-of-Tolerance Incidents Customer Complaint Case Study
Ms. Jennifer Fleenor, Tektronix

Effective Audit Preparation
Mr. Guy Robinson, Tektronix

SESSION 4
Wednesday, August 16, 2017 | 10:30 AM - 11:30 AM


4A – Metrology Education
Topic: Professional Development | Abstract
Room: Chesapeake DEF
Panel: Early Career Professionals and Career Planning

Panelists: Matt Aloisio, Radian Research; Jennifer Fleenor, Tektronix; Travis Gossman, Rockwell Collins;
Leah Lindstrom, The Boeing Company; Cody Luke, The Boeing Company


4B – Mechanical Measurements 
Topic: Mass | Abstracts 
Room: Chesapeake GHI 

Development of a New Scale for Aircraft Weighing
Mr. Gerhard Mihm, Technical Center for Information Technology and Electronics, Germany 

From the Kilogram of One... to the Metric Tonnes: Large Mass Calibrations at NIST 

Mr. Kevin Chesnutwood, National Institute of Standards and Technology (NIST)

4C – Quality Systems and Management 
Topic: Measurement Data Management | Abstract 
Room: Chesapeake JKL 
Panel: Vision, Progress and Discussion: A Metrology Information Infrastructure 
Panelists: Mark Kuster, Pantex Metrology; Michael Schwartz, Cal Lab Solutions; Colin Walker, Qualer


4D – Electrical Measurements
Topic: Resistance | Abstracts 

Room: Chesapeake BC 

Calibration of Programmable Loads 
Dr. Steven Yang, Standards and Calibration Laboratory 

Unmasking a Known Unknown, The Frequency Dependence of dc Standard Resistors 
Mr. Kai Wendler, National Research Council Canada (NRC)


SESSION 5

Wednesday, August 16, 2017 | 1:00 PM – 2:00 PM

5A – Metrology Education
Topic:  | Abstract
Room: Chesapeake DEF
Panel: A New Professional Recognition Scheme for Metrologists
Panelists: Keith Bevan, NPL; Gary Confalone, East Coast Metrology; Georgia Harris, NIST;
Pete Loftus, Rolls Royce; Tim Prior, NPL

5B – Mechanical Measurements
Topic: Dimensional | Abstracts
Room: Chesapeake GHI

Sphere Diameter Measurement by Interferometry with Repeatability that Breaks the Nanometer-Picometer Threshold
Mr. Eric Stanfield, National Institute of Standards and Technology (NIST)

X-Ray Computed Tomography for Dimensional Metrology
Dr. Meghan Shilling, National Institute of Standards and Technology (NIST)

5C – Statistics, Measurement Uncertainty, Measurement Decision Risk
Topic: Uncertainty | Abstract
Room: Chesapeake JKL
Panel: Inferred Uncertainty and Traceability?
Panelists: Dr. Charles Ehrlich, National Institute of Standards and Technology (NIST);  Jeff Gust,  Fluke Calibration; William Guthrie National Institute of Standards and Technology (NIST); Warren Merkel National Institute of Standards and Technology (NIST);  Bill Miller, Lockheed Martin, Denver Metrology services; Steven Phillips,  National Institute of Standards and Technology (NIST)

5D – Quality Systems and Management
Topic: Metrology in a Global Environment | Abstracts
Room: Chesapeake BC

Metrology, Citizenship and Trust: Metrology and its Social Value in Society
Dr. Salvador Echeverria-Villagomez, Centro Nacional de Metrologia, Mexico

Maintaining Quality in a Global Calibration Partner Program
Mr. Paul Packebush, National Instruments

SESSION 6
Wednesday, August 16, 2017 | 2:30 PM – 4:00 PM

6A – Metrology Education
Topic: Industry Partnerships and Education | Abstracts
Room: Chesapeake DEF

Relationship between Biomedical Engineering and Metrology for Project Development
Mr. Roberto Benitez, Etalons SA de CV

The Inclusion of Didactic Metrological Activities in Education
Mr. Julio Jimenez, Universidad Politecnica de Santa Rosa Jaureui

Industry Partnering with Higher Education, “Driving Business Success”
Mr. Steven Stahley, Cummins Inc.


6B – Mechanical Measurements

Topic: Mass | Abstracts
Room: Chesapeake GHI

Calibration of Environmental Sensors for Mass Metrology
Mr. Edward Mulhern, National Institute of Standards and Technology (NIST)

Primary Reference for Small Mass Based on Electrostatics
Dr. Gordon Shaw, National Institute of Standards and Technology (NIST)

Comparison of Gravimetric and Resonator Based Mass Measurements

Dr. Hamza Shakeel, National Institute of Standards and Technology (NIST)

6C – Statistics, Measurement Uncertainty, Measurement Decision Risk
Topic: Conformance Testing | Abstracts
Room: Chesapeake JKL

Should the Repeatability of the Instrument Under Test be Included in Test Uncertainty?
Dr. Craig Shakarji, National Institute of Standards and Technology (NIST)

Measurement Uncertainty, Decision Risk, and the Contract Process
Mr. Travis Gossman, Rockwell Collins

Strategies for Dealing with Low Test Uncertainty Ratios
Dr. Dennis Jackson, NSWC, Corona Division


6D – Precision & Performance
Topic: Safety and Measurement Methods | Abstracts
Room: Chesapeake BC

Developing a Standard Test Methodology for the Evaluation of Vaccine Storage Units
Michal Chojnacky, National Institute of Standards and Technology (NIST)

Technical Challenges in the Development of a New UHV Pressure Standard (Cold Atom Trap Vacuum Standard)
Ms. Julia Scherschligt, National Institute of Standards and Technology (NIST)

Changing Methodology in a Cable Tension Meter Calibration
Mr. Fred Blake, Exelon PowerLabs

SESSION 7
Thursday, August 17, 2017 | 10:30 AM - 11:30 AM

7A: Quality Systems and Management
Topic: ISO/IEC 17025 Round Table | Abstracts

Room: Chesapeake DEF
Panelists: Andy Henson, Bureau international des poids et mesures (BIPM); Jeff Gust, Fluke Calibration; Georgette Macdonald, National Research Center Canada (NRC); Trace McInturff, American Association of Laboratory Accreditation (A2LA); Trevor Thompson, United Kingdom Accreditation Service (UKAS)

 

7B – Mechanical Measurements
Topic: Pressure & Flow | Abstracts
Room: Chesapeake GHI

Determination of the Blockage Effect on a Thermal Anemometer using a Small Open Jet Wind Tunnel
Dr. Stephen Rickaby, Antech Calibration Services

Modernized Piston Gauge Calibrations at NIST
Ms. Julia Scherschligt, National Institute of Standards and Technology (NIST)


7C – Electrical Measurements

Topic: Voltage | Abstracts
Room: Chesapeake JKL

Qualification and Uncertainty Analysis of an Electric Field Mill Calibration System
Dr. Elizabeth Auden, Sandia National Laboratories

Maximum Voltage and Possible Over Voltage Failure Mechanism of Multijunction Thermal Converters
Dr. Stefan Cular, National Institute of Standards and Technology (NIST)

SESSION 8
Thursday, August 17, 2017 | 1:00 PM – 2:00 PM

8A – Quality Systems and Management
Topic: ISO/IEC 17025 Compliance Challenges | Abstracts
Room: Chesapeake DEF

Decision Rule Reporting to Comply with Revised ISO/IEC 17025
Mr. Bob Stern, Keysight Technologies

Balancing Cost Savings and ISO/IEC 17025
Mr. Gary Bennett, National Instruments

8B – Global Standards
Topic: International Collaborations | Abstracts
Room: Chesapeake GHI

EA-Sponsored Interlaboratory Comparisons in Europe: The Process and the Lessons Learned
Mrs. Simona Klenovska, Czech Metrology Institute

SI Redefinition and the Role of the CODATA Task Group on Fundamental Constants
Dr. Barry Wood, National Research Council of Canada (NRC)

8C – Electrical Measurements
Topic: Electrical | Abstracts
Room: Chesapeake JKL

Understanding Transducer Calibration and Recent Technological Improvements
Mr. Aaron Offringa, Vibration Research

Effects of Lead Construction and Materials on AC Voltage Measurements
Mr. Michael Bailey, Transmille Ltd

SESSION 9
Thursday, August 17, 2017 | 2:30 PM – 4:00 PM

9A – Metrology Education
Topic: Metrology Outreach and Collaboration | Abstracts
Room: Chesapeake DEF

Metrology Outreach and Training: A Fulbright Experience in Mexico
Ms. Georgia Harris, National Institute of Standards and Technology (NIST)

Experience of Uruguay Bringing Metrology Closer to the Population
Mrs. Claudia Santo, Laboratorio Tecnológico Del Uruguay  (LATU)

Metrology and Higher Learning
Mr. Ben Jack, JM Test Systems

9B – Cutting Edge Metrology
Topic: Mass | Abstracts
Room: Chesapeake GHI

The Measurement of the Mass of a Magnetically Suspended Artifact and its Uncertainty
Dr. Corey Stambaugh, National Institute of Standards and Technology (NIST)

Redefinition of the Kilogram: The Effect on Mass Dissemination from NIST
Mr. Patrick Abbott, National Institute of Standards and Technology (NIST)

9C – Quality Systems and Management
Topic: Software | Abstracts
Room: Chesapeake JKL

How New Technology Can Automate OOT Reporting and Close the Measurement GAP
Mr. Chris Campbell, AssetSmart

Progress Report Standardized XML Representation of ISO/IEC 17025 Scope of Accreditation Data 
Mr. David Zajac, Cal Lab Solutions, Inc.

The New ISO 17034 and Reference Material Producer Accreditation
Ms. Ashly Carter, American Association for Laboratory Accreditation (A2LA)

9D – Mechanical Measurements
Topic: Dimensional | Abstracts
Room: Chesapeake BC

Setting the Length of the Meter – How Hard Could it Be?
Dr. Ted Doiron, National Institute of Standards and Technology (NIST)

The Comparison of Different Types of Instruments on Nanoparticle Size Measurements through Interlaboratory Comparisons
Ms. Hsiu-Lin Lin, Center for Measurement Standards/Industrial Technology Research Institute

Concerns with Selecting Calibration Methods and Reporting Results
Mr. Jim Salsbury PhD, Mitutoyo America Corporation


Updated 8/1/2017