NCSLI Technical Exchange
Measurement Training Program

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TE-1 | Monday, January 23 
One-Day (8 Hours) | 8:00 AM to 5:00 PM
Course Title:  Understanding ISO/IEC 17025 Requirements
Instructor: Rob Knake, American Association of Laboratory Accreditation (A2LA)

TE-2 | Monday, January 23
One-Day (8 Hours) | 8:00 AM to 5:00 PM
Course Title: 

Improved Performance via Process Mapping


Instructor: Dean Williams, Duke Energy

TE-3 | Monday, January 23
½ Day (4 hours) | 8:00 AM to 12:00 PM

Course Title: 

Risk Based Thinking in Metrology


Instructor: Andy Oldershaw, National Research Council Canada (NRCC)

TE-4 | Monday, January 23
One-Day (8 Hours) | 8:00 AM to 5:00 PM
Course Title: 

Geometric Dimensioning & Tolerancing (GD&T) Applied to Gage and Fixture Definition


Instructor: Tony Bryce, Sandia National Laboratories

TE-5 | Monday, January 23
½ Day (4 hours) | 8:00 AM to 12:00 PM

Course Title: 

Vibration and Shock Sensor Theory and Calibration

Instructor: Eric Seller, The Modal Shop

TE-6 | Monday, January 23, and Tuesday, January 24
Two-Day (16 Hours) | 8:00 AM to 5:00 PM

Course Title: 

Selection, Calibration, and Use of Contact Thermometers 


Instructor: Dawn Cross, National Institute of Standards and Technology (NIST) 
 
TE-7 | Monday, January 23 and Tuesday, January 24
Two-Day (16 Hours) | 8:00 AM to 5:00 PM

Course Title: 

Pressure and Vacuum Measurement


Instructor: Jacob Ricker, National Institute of Standards and Technology (NIST) 

TE-8 | Monday, January 23 and Tuesday, January 24

Two-Day (16 Hours) | 8:00 AM to 5:00 PM
Course Title: Flow Measurement and Uncertainties

Instructor: John Wright, National Institute of Standards and Technology (NIST)

TE-9 | Monday, January 23 
One-Day (8 Hours) | 8:00 AM to 5:00 PM

Course Title:  AC Current Measurements
Instructor: Milen Todorakev , Fluke Calibration

TE-10 | Monday, January 23  
½ Day (4 hours) | 1:00 PM to 5:00 PM

Course Title: Microwave Measurement Basics


Instructor: 
Ronald Ginley, National Institute of Standards and Technology (NIST)

TE-11 | Monday, January 23  
½ Day (4 hours) |1:00 PM to 5:00 PM

Course Title:  Humidity Calibration Uncertainty
Instructor:
Dr. Cesar “Jun” Bautista, Masy BioServices

TE-12 |Tuesday, January 24 
½ Day (4 hours) | 8:00 AM to 12:00 PM
Course Title:

Achieving Accreditation: Traceability, CMC’s Software Validation and Assessment Survival


Instructor:
Greg Strouse, National Institute of Standards and Technology (NIST)

TE-13 |Tuesday, January 24 
One-Day (8 hours) | 8:00 AM to 5:00 PM
Course Title: 

Measurement Uncertainties


Instructor: 
Dilip Shah, E=MC3 Solutions

TE-14 | Tuesday, January 24 
One-Day (8 Hours) | 8:00 AM to 5:00 PM

Course Title: 

Understanding RF Power Calibrations at 1mW and 250W


Instructor: Charlie Sperrazza, TEGAM, Inc.

TE-15 | Tuesday, January 24 
One-Day (8 hours) | 8:00 AM to 5:00 PM
Course Title: 

Measuring and Characterizing Surface Topography


Instructor: Hy Tran, Sandia National Laboratories

TE-16 | Tuesday, January 24 
One-Day (8 Hours) | 8:00 AM to 5:00 PM

Course Title: 

Good Weighing Practices


Instructor:
Ian Ciesniewski, Mettler-Toledo, LLC  
 
TE-17 | Tuesday, January 24 
One-Day (8 hours) | 8:00 AM to 5:00 PM

Course Title: 

Temperature Monitoring and Traceability in the Cold Chain


Instructor: Dr. Cesar “Jun” Bautista, Masy BioServices

TE-18 | Tuesday, January 24
½ Day (4 hours) | 1:00 PM to 5:00 PM

Course Title: Root Cause Analysis
Instructor: Colin Reitman, American Association of Laboratory Accreditation (A2LA)

TE-19 |Tuesday, January 24 and Wednesday, January 25 |NEW CLASS Runs Tuesday and Wednesday
Two-Day (16 Hours) | 8:00 AM to 5:00 PM

Course Title: The NIST Uncertainty Machine and the NIST Consensus Builder
Instructor: Antonio Possolo, PhD, National Institute of Standards and Technology (NIST)

Course Descriptions

TE-1 | Monday, January 23 | 8:00 AM - 5:00 PM | One-Day 
Course Title: Understanding ISO/IEC 17025 Requirements
Instructor: Rob Knake, American Association of Laboratory Management (A2LA)
Topic: Laboratory Management
Course Description: Beginner – course content is designed for students with no previous experience Full-day tutorial will cover highlights of ISO/IEC 17025 requirements. This course is applicable for organizations that are currently accredited, are in the process of obtaining their ISO/IEC 17025 accreditation or for those who are interested in applying the ISO/IEC 17025 requirements in their facility.
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TE-2 | Monday, January 23 | 8:00 AM - 5:00 PM | One-Day  
Title: Improved Performance via Process Mapping

Instructor: Dean Williams, Duke Energy
Topic: Laboratory Management
Course Description: This workshop starts by providing a brief history and background for TLS (Theory of Constraints, Lean, Six Sigma) as an integrated performance improvement strategy. The workshop will then go on to describe the principals and practices from TLS associated with process mapping as a basic tool of continuous improvement. Included will be specific metrics that can be used to measure current and future performance of process flows within a calibration lab environment.

With that basic knowledge in hand, class members will then work as a group to create a typical current state process flow map, identifying “rocks” in the flow stream that will need to be removed to reduce drag and increase process flow. Applying the TLS tools the group was exposed to earlier, the class will then, as a group, develop a future state process flow map and a 30/60/90 day prioritized action plan for achieving the desired future state.

By the conclusion of the workshop the participants will be able to apply basic process mapping techniques, identify obstacles to process flow, and develop a prioritized action plan for transitioning from current state to a desired future state process. 
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TE-3 | Monday, January 23 | 8:00 AM - 12:00 PM | ½ Day AM 
Course Title: Risk Based Thinking in Metrology
Instructor: Andy Oldershaw, National Research Council Canada (NRCC)
Topic: Laboratory Management
Course Description: Management system standards are a one size fits all solution, tailorable through statements such as to the extent necessary, as appropriate, sufficient to…
Risk based thinking has been a growing trend spreading to all aspects of the economy and society for many years. It will become more prominent for laboratories with the adoption of the upcoming ISO/IEC 17025 revision.
This module will help those involved planning, managing, implementing and reviewing any aspect of laboratory management systems to apply risk based thinking to determine what these statements mean to their particular situation.
Tools and techniques to identify, analyse, respond to, monitor and review risks will be introduced. Participants will have the opportunity to put them into practice during class room exercises. 
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TE-4 | Monday, January 23 | 8:00 AM - 5:00 PM | One-Day 
Course Title: Geometric Dimensioning and Tolerancing (GD&T) Application to Gage Calibration Requirements
Instructor:
E.A. “Tony” Bryce, Sandia National Laboratories
Topic: Dimensional
Course Description: A basic introduction to the concepts of GD&T and the application to gage certification requirements. This course is suitable for those individuals needing a basic understanding of the concepts related to drawing and CAD model definition. The course will cover symbol interpretation, feature control frames, datums and datum reference frames (DRF), material conditions (MMC & LMC), positional tolerancing, profile tolerancing, orientation (parallelism, angularity and perpendicularity), profile tolerancing and runout. Application of concepts to gage requirements. This course is based on ASME Y14.5 standard.
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TE-5 | Monday, January 23 | 8:00 AM - 12:00 PM | ½ Day AM
Course Title: Vibration and Shock Sensor Theory and Calibration
Instructor: Eric Seller, The Modal Shop
Topic: Physical
Course Description: This four-hour tutorial on vibration calibration will dive into calibration theory, standards, and methodology for dynamic sensors as well as explanations of different sensor types and the operational theories behind them. Target audience is beginner to intermediate level. 
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TE-6 | Monday, January 23 and Tuesday, January 24 | 8:00 AM - 5:00 PM |Two-Day 
Title: Selection, Calibration, and Use of Contact Thermometers

Instructor: Dawn Cross, National Institute of Standards and Technology (NIST)
Topic: Dimensional
Course Description: In this seminar, we will discuss contact thermometers commonly used in industry for applications that use platinum resistance thermometers, thermistors, and thermocouples. 

Lecture topics covered will include:
  • Thermometer overview of each type, characteristics, and expected uncertainties
  • Selecting a thermometer for a specific application
  • Creating a calibration uncertainty budget and a temperature measurement uncertainty budget
  • Selecting and using digital thermometers
  • Calibration techniques and measurement validation methods
  • Alternatives to traditional calendar recall dates for recalibration
  • Statistical process control and maintaining traceability to NIST
  • The step-by-step development of a Scope of Accreditation (e.g. uncertainty budgets) for different temperature calibration services
  • An assessor’s point of view during an on-site technical assessment
  • Proficiency tests for achieving accreditation
Laboratory session will include:
  • Using digital thermometers
  • Using an ice melting to check the calibration status of your thermometer
  • Determining the uncertainty of a dry-well block calibrator
Exploring the measurement differences and uncertainties between digital thermometers 
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TE-7 | Monday, January 23 and Tuesday, January 24 | 8:00 AM - 5:00 PM |Two-Day
Course Title: Pressure and Vacuum Measurement
Instructor: Jacob Ricker, National Institute of Standards and Technology (NIST) 
Topic: Dimensional
Course Description: Making good pressure measurements from ultra-high vacuum to atmospheric pressure and higher requires the correct use of many kinds of gauges and proper use of vacuum technology. Among the most widely used gauges are ionization gauges, spinning rotor gauges, thermal conductivity gauges, capacitance diaphragm gauges, quartz bourdon tube gauges, and resonant silicon gauges. However, the incorrect use of any of these gauges can result in bad measurements that cost time and money. This two-day course will cover the fundamentals of pressure measurements from 10-8 Pa to 10+8 Pa (10-10 torr to 10+6 torr), focusing on the selection and proper use of appropriate gauging technology for a given application. A survey of calibration techniques will be presented along with recommendations for obtaining best performance. Part of the class time will be devoted to set-up of a simple vacuum calibration system. This will enable live demonstration of some of the gauges discussed in the course, and give students an opportunity to participate in the vacuum system set-up and disassembly. 

New for this year is a section devoted to the use of piston gauges as the reference standard. We will also bring back the popular overview of good vacuum system design and construction using off-the-shelf vacuum equipment and fittings. Basic vacuum system design do's and don'ts will be covered. Pumping systems, sealing systems, valves, and vacuum plumbing solutions will be briefly covered. For pressures substantially higher than atmosphere, proper selection and operation of piston gauges for gas and oil calibrations will be covered. Attendees are invited to share their own pressure measurement and or vacuum system design problems for in-class discussion. 
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TE-8 | Monday, January 23 and Tuesday, January 24 | 8:00 AM - 5:00 PM |Two-Day
Course Title: Flow Measurement and Uncertainties
Instructor: John Wright, National Institute of Standards and Technology (NIST)
Topic: Dimensional
Course Description: We will cover background metrology and fluid mechanics subjects that are important for flow measurement including:
  • the transition from laminar to turbulent flow
  • pipe flow profiles and boundary layer concepts
  • the continuity equation and conservation of mass
  • fluid and gas properties and their calculation
  • Pressure and temperature measurement

The operating principles and equation of flow for the commonly used flow measurement techniques will be derived and explained including:

  • Differential pressure devices (laminar flow meters, orifice plates, venturi tubes)
  • Critical flow venturis and nozzles
  • Ultrasonic flow meters
  • Turbine and positive displacement meters
  • Electromagnetic flow meters
  • Coriolis flow meters
  • Thermal meters
  • Rotameters
Methods of flow meter calibration used in laboratory, including NIST standards will be covered. Field conditions will be discussed as well as installation effects and how distorted velocity profiles affect flowmeter accuracy. Flow calculations and uncertainty analyses for certain flow meter types will be taught. 

Our goal is cover topics with a range of physics and mathematical difficulty so that the course will be of interest to students with a wide range of mathematical backgrounds and flowmeter experience. Distributed throughout the course, there will be optional, advanced sections of interest to only extreme flow geeks. 
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TE-9 | Monday, January 23 | 8:00 AM - 5:00 PM |One-Day
Course Title: AC Current Measurements
Instructor:  Milen Todorakev, Fluke Calibration
Topic: Electrical
Course Description:
Course Description: 
The course will cover alternating current measurement methods, measurement devices, evaluation of measurement errors and uncertainty. During this module, the participants will have the opportunity to use measurement equipment to associate the class material to its practical application. 

Intended audience: Anyone involved in measurements of alternating current and/or evaluation of uncertainty associated with these measurements. 

Learning Objectives:

Participants will gain knowledge about:
  • Basics of alternating current measurements.
  • Identification of measurement errors associated with alternating current measurements.
  • Techniques for avoiding/minimizing measurement errors.
  • Generating measurement uncertainty analysis.
  • Practical experience in making measurement using various measurement techniques/methods
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TE-10 | Monday, January 23 | 1:00 PM - 5:00 PM |½ Day PM
Course Title: Microwave Measurement Basics
Instructor: Ronald Ginley
Topic: Electrical
Course Description: Have you ever wanted to learn more about microwave measurement techniques?  This session is the place to be!  An introduction to the measurement concepts for microwave power and scattering-parameters will be covered. Specific topics covered will include transmission line theory, practical handling or the do’s and don’ts for transmission lines and microwave connectors, Vector Network Analyzer calibration/measurements and real world sources of uncertainties, microwave power detectors types, power measurements and uncertainties, and the session will conclude with a discussion of verification techniques for microwave measurements.
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TE-11 | Monday, January 23 | 1:00 PM - 5:00 PM | ½ Day PM
Course Title: Humidity Calibration Uncertainty
Instructor: Dr. Cesar "Jun" Bautista, Masy BioServices
Topic:
Course Description: This presentation will touch upon chamber calibration related topics with special emphasis on humidity chambers in terms of the most recent updates, proposed changes, recommended practices, and compliance to the mandates and conformance to established local and international standards and guidelines. Highlighted during this presentation will be the measurement uncertainties that may necessarily be considered when calibrating climatic chambers. I will also be demonstrating the concept of 0% RH as a reference (not a measurement) point and the rationale behind its usage. As a bonus, we will be exhibiting new concepts in climatic chamber design and manufacturing that support the measurement uncertainty elements in climatic chamber calibrations.
Learning Objectives:

  • Climatic Chambers (Humidity Chambers) Design Concepts, 2 Pressure Generator vs. Vapor Mixing
  • Calibration Methods
  • Measurement Uncertainties in the Calibration and Certification of Humidity Chambers
  • Future Look and Features of Humidity Chambers and the Market Demands and Challenges
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TE-12 | Tuesday, January 24 | 8:00 AM – 12:00 PM | ½ Day AM
Course Title: Achieving Accreditation: Traceability, CMC’s Software Validation and Assessment Survival
Instructor: Greg Strouse, National Institute of Standards and Technology (NIST)
Topic: Laboratory Management
Course Description: This seminar will discuss several topics regarding various aspects of achieving accreditation including:

  • How traceability to the SI is created and defined
  • Maintenance of the traceability chain
  • How traceability plays a critical role in 17025
  • Developing Calibration and Measurement Capabilities (CMCs) for inclusion in a Scope of Accreditation
  • 17025 requirements of software validation and the assessor interpretation
  • Preparing for an assessment – what does an assessor look for in the implementation of a Quality System
  • Understanding the NIST and the international metrology puzzles
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TE-13 |Tuesday, January 24 | 8:00 AM – 5:00 PM | One-Day
Title: Measurement Uncertainty – Fundamental Applications
Instructor:
Dilip Shah, E=MC3 Solutions
Topic: Measurement Uncertainty
Course Description: This is a full-day, beginner to intermediate level workshop targeted towards metrologists, technicians and engineers. This workshop will also be useful for specifiers of calibration services. This workshop covers the Measurement Uncertainty fundamentals for metrology professionals new to the subject. Statistical concepts relevant to Metrology and Measurement Uncertainty are introduced, explained and demonstrated. The process of measurement uncertainty estimation is demonstrated per the guidelines from the ISO Guide to the Expression of Uncertainty in Measurement (GUM).
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TE-14 | Tuesday, January 24 | 8:00 AM - 5:00 PM |One-Day
Course Title: Understanding RF Power Calibrations at 1mW and 250W
Instructor: Charlie Sperrazza, TEGAM, Inc. 
Topic: Electrical
Course Description: This one day workshop provides a practical introduction to 1mW RF power transfer between two coupled ports with discussions on key components and methods for power sensor calibrations. It includes Gamma correction and how to use Gamma correction to calculate power transfer and port match, and the importance of vector measurements to the precise knowledge of power transfer. The workshop will also cover typical arrangements of RF Power Sensor Calibration stations; the step-by-step process of calibrating thermocouple, thermistor and EEPROM power sensors; contributing factors to uncertainty of a calibration factor; practical examples, with Excel Spreadsheet and real data of calculating expanded uncertainty of a calibration factor; and understanding linearity of power sensors including new developments and designs in RF Power Sensors design has allowed for large power dynamic ranges. 

The workshop will also include an introduction to 250W power measurements and calibration techniques for wattmeter element test and calibration. Workshop will include a discussion of the components required to produce these measurements and the factors that contribute to uncertainties as well as the unique challenges of measurement and calibration at these power levels and methods to mitigate them. 
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TE-15 | Tuesday, January 24 | 8:00 AM – 5:00 PM | One-Day 
Title: Measuring and Characterizing Surface Topography
Instructor:
Hy Tran, Sandia National Laboratories
Topic: Dimensional
Course Description: Surfaces cover everything—and they influence behavior and performance of parts. In this tutorial, we will focus on the topography of surfaces—the texture and roughness. Texture includes both short spatial wavelength components (what one would call roughness) and longer wavelength components (what one would call waviness and form). Texture may have directionality (lay). These qualities are specified in mechanical product drawings, and the evaluation of roughness is defined in both ASME and ISO standards. This tutorial provides an introduction to surface metrology and to the evaluation of roughness.
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TE-16 | Tuesday, January 24 | 8:00 AM - 5:00 PM |One-Day
Course Title: Good Weighing Practices
Instructor: Ian Ciesniewski, Mettler-Toledo, LLC
Topic: Physical
Course Description: Did you know that a balance calibration is incomplete, without a statement of measurement uncertainty? Or that balance uncertainty is largely independent of loaded mass? Most analytical balance weighing inaccuracies occur outside of the balance, but are attributable to influences within the control of the user. Most calibration regimes contain elements of legacy metrology programs that have been passed directly down from mechanical weighing instruments, even though the components of measurement uncertainty exhibit themselves differently, for an electronic weighing instrument. Many organizations “Over test” without generating much meaningful metrology. 

During this session, we will break down how measurement uncertainty exhibits itself, across the capacity of an electronic balance or scale. We will cover how to assess and assign a Measurement Uncertainty budget for an electronic balance or scale, and discuss robust, risk-based approaches to the assessment and estimation of significant, contributing uncertainty components, in order to build a thorough, yet scientifically-sound risk-based metrology program for bench or floor weighing instruments. We will cover overcoming potential errors, and optimize a balance metrology regime. Focusing on:
  • Factors influencing Measurement Uncertainty
  • Balance location and set up
  • User testing
  • Personal weighing technique
  • Increasing productivity from your weighing equipment
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TE-17 | Tuesday, January 24 | 8:00 AM - 5:00 PM |One-Day
Course Title: Temperature Monitoring and Traceability in the Cold Chain
Instructor: Dr. Cesar “Jun” Bautista, Masy BioServices
Topic: Dimensional
Course Description: In this seminar, participants will learn effective temperature monitoring strategies for use in cold-chain transport and storage of temperature-sensitive products. NIST has collaborated extensively with the Centers for Disease Control to develop improved guidelines for temperature monitoring of vaccines at the provider-office level. As the range of temperature-sensitive products in our world continues to increase, so does the demand for accurate, traceable temperature monitoring solutions, coupled with cost-effective calibration methodologies. This one-day seminar is designed to address the needs of staff directly involved with the management, storage and transport of cold-chain products, as well as device manufacturers and calibration facilities endeavoring to meet the needs of this rapidly-expanding field. The seminar includes a lecture session followed by a hands-on learning experience. 
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TE-18 | Tuesday, January 24 | 1:00 PM - 5:00 PM | ½ Day PM
Course Title: Root Cause Analysis
Instructor: Colin Reitman, American Association of Laboratory Accreditation (A2LA)
Topic: Laboratory Management
Course Description: Root cause analysis is the foundation on which effective corrective and preventative actions are built. This course will give you the tools you need to perform root cause analysis, create clear corrective actions and preventative actions, and implement continual improvements to quality management systems. The emphasis will be on ISO/IEC 17025 requirements, and the course objectives will be achieved through lecture and several in-class activities 
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TE-19 |Tuesday, January 24 and Wednesday January 25 |NEW CLASS Runs Tuesday and Wednesday
8:00 AM to 5:00 PM |Two Day (16 Hours)

Course Title: The NIST Uncertainty Machine and the NIST Consensus Builder
Instructor: Antonio Possolo, PhD, National Institute of Standards and Technology (NIST)
Topic:
Course Description:  The NIST Uncertainty Machine (NUM) and the NIST Consensus Builder (NICOB) are web-based applications accessible worldwide via any internet browser. The NUM provides a user-friendly interface to uncertainty analysis for measurement models of the type described in the GUM (“Guide to the Expression of Uncertainty in Measurement”), using the GUM approach and also the Monte Carlo method of the GUM Supplement 1.  The NICOB provides a user-friendly interface for the analysis and reduction of measurement results obtained in interlaboratory studies, including key comparisons: computation of consensus values, characterization of associated uncertainty, evaluations of reproducibility, and degrees of equivalence.
 
This course will provide a hands-on familiarization with the NUM and with the NICOB, using concrete examples and real data from a wide range of fields of measurement science, and will also give the participants sufficient background and guidelines to empower them to make the particular choices needed to apply these tools thoughtfully and appropriately. The participants will have the opportunity to apply these tools also to their own data during the course, and to share their experiences while doing so.
 
The participants are expected to have general familiarity with the basic notions and methods of uncertainty analysis as are explained in the GUM (or in NIST Technical Notes 1297 and 1900), but do not need to possess specialized knowledge of probabilistic or statistical methods. The course will include a brief tutorial introduction to the R environment for statistical computing and graphics, which the participants may like to use to supplement some of the calculations done using the NUM or the NICOB.

Each Participant attending this tutorial should bring a laptop computer to the course.
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NCSLI Technical Exchange 2017 | Updated 11-2-2016