The theme of the meeting is “Advanced Measurement Techniques.” A number of papers will be presented ranging from “Improved Verification and Confidence in your Multiproduct Calibrators using a Reference Multimeter” to “Increasing Confidence in S Parameter Measurements.”
Lab Tour: Guided visit of the National Instruments Metrology Service Laboratory and R&D Metrology Laboratory.
NCSLI Meeting Coordinator:
11500 N. Mopac Expwy.
Austin, TX 78759
Meeting Time & Location:
Table Top Exhibits:
8:00 AM - 4:00 PM
11500 N. Mopac Expwy.
Austin, TX 78759
Additel, Measurements International, Maury Microwave, Mensor,
Acudata, Continental Resources, Eletro-Rent, Test Equity, Fluke, Tegam, Rohde & Schwarz,
Topic: Calibrating a Mixer for Group Delay
Speakers’ Name: Robert Feldman, National Instruments
Abstract: Calibrating a mixer can be extremely challenging and difficult. Learn how National Instruments metrologists are calibrating mixers to realize delay measurements using group delay from a VNA. You will leave with a basic understanding of group delay and how these measurements can be translated into distance.
Learning Objectives: Learn the basics of creating a calibrated mixer for frequency conversion measurements that would be utilized with a VNA to make group delay measurements.
Topic: Expectations of B2B Communications
Speakers’ Name: Kevin Kaufman, Tegam
Abstract: In this age of electronic communication, we have gained many benefits in saved time and energy in the execution of day-to-day business transactions…but at what cost? In this presentation we will explore various forms of business-to-business, (B2B), communications; user’s expectations regarding when and how they should be used; the challenges of the technology; and the ramifications of breaking these new social norms.
Topic: Improved verification of and confidence in your Multiproduct Calibrators using a Reference Multimeter
Speakers’ Name: Marty Kidd, Fluke
Abstract: Multiproduct Calibrators are typically the most utilized standard in an Electrical Calibration Lab. While some Labs have the standards required to fully verify performance internally, this can be a time consuming and tedious endeavor. For these customers, advancements in Reference DMM technology now allow labs that verify their own Multiproduct Calibrators to simplify this verification process. Other labs must rely on a third party to verify this critical standard is performing to specification each year. These Labs can improve their confidence between annual verifications using a reference DMM to quickly verify key functions on a periodic basis.
Learning Objectives: Understanding new Reference DMM capabilities and how they can apply to Multiproduct Calibrators, How a Refence DMM can simplify the Verification Process, Why using a Reference DMM to Periodically verify key functions of a Multiproduct Calibrator will improve confidence between annual Verifications.
Topic: Common Considerations for Temperature Measurement and Calibration
Speakers’ Name: Chris Christofferson, Additel
Abstract: Learn about the basic foundations of temperature measurement before diving into thermometer types and their characteristics while exploring the advantages and disadvantages of each. Basic examples will be covered along with a brief look at calibration procedure concerns and measurement methodology. Common errors that users may not be aware of when using Drywell Calibrators will also be discussed. You will also learn when you need to use an external reference thermometer and when you might not need to. In addition, new innovations in Drywell manufacturing to improve productivity and throughput will be covered. This will be an open discussion where you can ask all the questions you would like.
Learning Objectives: To provide insight and education regarding a broad range of temperature measurement equipment.
Topic: Increasing Confidence in S Parameter Measurements
Speakers’ Name: Tekamul Buber, Maury Microwave
Abstract: There has always been a need for characterizing S parameter data with uncertainties and while there have been established methodologies for years, the process has been limited to metrologists and has not been accessible to common engineering or production labs. In addition, the old methodologies were not complete as they didn’t capture all the sources of errors that affected measurements. Today these limitations have been overcome. The objective of this presentation is to discuss how to derive complete confidence in S parameter measurements by understanding the uncertainty contributions of each component in the measurement chain. The traditional method of estimating uncertainties and validating calibration is to estimate residual error terms experimentally using airline and reflect standards. This presentation will discuss the limitations of the traditional method and introduce a comprehensive method that enables users to obtain traceable measurement results. A pre-characterized verification device with uncertainties enables the user to have an insight into other errors during calibration, which are not otherwise covered by the calculated uncertainties, e.g., operator error, cable failure or a defective calibration standard and can thus decide to replace or re-calibrate. In essence, combining the ability to build a comprehensive uncertainty budget that includes all the factors that affect measurement accuracy along with the ability to validate calibration quantitatively empowers the user to provide the most accurate data to their customers with confidence.
Learning Objectives: Identify the key sources of uncertainties in an S parameter measurement setup, Recognize the limitations of residual errors to validate S parameter calibration and measurements, Outline the best practice guidelines in propagating uncertainties to the S parameters of the DUT, Establish validation mechanisms to gain confidence in data, Recognize tools available to achieve these objectives
7:00 – 8:00 – Vendor Arrival and Set-up
8:00 – 9:00 – Meeting Registration and breakfast provided by National Instruments
9:00 – 9:15 – Welcome and introduction – Adam Croan, National Instruments
9:15 – 10:00 – Marty Kidd - Improved verification and confidence in your Multiproduct Calibrators using a Reference Multimeter
10:00 – 10:45 – Tekamul Buber - Increasing Confidence in S Parameter Measurements
10:45 – 11:30 – Kevin Kaufman - Expectations of B2B Communications
11:30 – 13:00 – Lunch provided by National Instruments/Visit with Vendors
13:00 – 13:45 – Chris Christofferson - Common Considerations for Temperature Measurement and Calibration
13:45 – 14:30 - Robert Feldman - Calibrating a Mixer for Group Delay
14:30 – 15:00 – Jorge Martins - Door prizes and closing remarks
15:00 – Visit the National Instruments R&D and Service Metrology Laboratory