Mid-Atlantic Region -
Virginia Section (1213)

Virginia Section Coordinator

Upcoming Meetings and Events

NCSLI Virginia Section Meeting (1213)
Tuesday, October 4, 2016
Please Join Us!

     Meeting Registration            Student Registration Form      Presenter Registration Form 

Meeting Overview:
Join our NCSLI Virginia Section Meeting on October 4, 2016 at 8:00AM in Hampton, VA.
This meeting we have two speakers who are experts in the Metrology industry. 
The meeting will bring local NCSL International members and non-members from Virginia together for networking, education, and training.

Meeting Coordinator:
Richard Hogan
ACR Technical Services, Inc.
710 Industrial Park Dr.
Newport News, VA 23608

Meeting Date:
Tuesday, October 4, 2016

Meeting Time:

8:00 AM to 3:30 PM

Cost to attend meeting: 
  NCSL International
Complimentary Training Session

Meeting Sponsor:
ACR Technical Services, Inc

Meeting Location:
Old Dominion University Peninsula Center
600 Butler Farm Rd.
Hampton, VA 23606

From Newport News/Richmond
1. Take exit 261B, Hampton Roads Center Parkway,
2. Continue on Hampton Center Pkwy for 0.7mi.
3. Take Ramp onto Magruder Blvd.
4. Turn left onto Magruder Blvd.
5. Continue on Magruder Blvd for 0.5mi.
6. Turn left onto Butler Farm Rd.
7. Continue on Butler Farm Rd. for 0.8mi.
8. Destination will be on the right.

From Norfolk/VA Beach
1. Take exit 262B, for VA-134/Magruder Blvd.
2. Continue on VA-134/Magruder Blvd.for 0.7mi.
3. Turn left onto Butler Farm Rd.
4. Continue on Butler Farm Rd. for 0.8mi.
5. Destination will be on the right.

Google Maps


Topic: Thermal Measurement Challenges in Advanced Manufacturing and the Quantum SI
Speaker: Greg Strouse, National Institute of Standards and Technology, NIST 

Abstract: One goal for improving the dissemination of standards is to reduce the need for the routine exchange of artifacts between an NMI and those seeking measurement assurance, by developing sensors and instruments that are inherently more accurate and stable than those in common use today. Another is the development of innovative sensors that—through improvements in cost, size, speed, durability, and other factors—may be more effectively utilized within manufacturing plants and products. As examples, laser-based cutting, welding, and sintering in additive manufacturing processes would benefit from improved real-time monitoring of process temperature. Similarly, networks of small and precise sensors embedded within structures and composite materials could improve their performance and reliability. These sensors draw upon a range of technologies not previously exploited for these applications, such as nanofabrication, photonics, and atomic physics.
NIST is focusing its efforts on several critical projects including the development of a photonic pressure, temperature, and length standard to determine the Boltzmann constant (a goal of < 10 ppm) and to realize the unit of the kelvin; a Johnson Noise thermometer to determine the Boltzmann constant (< 4 ppm) and as a thermodynamic thermometer (< 10 ppm); and a photonic thermometer (< 5 mK). Embedded dual-mode, quantum-effect devices may be both a standard and sensor. These self-calibrating nanoscale miniaturized sensors include an intrinsic SI traceable standard with the sensor in a multi-function platform thus obviating the need for frequent calibrations. For example, two dual-mode devices in development include 1) a nanoscale opto-mechanical thermometer that as a standard relies on the phonon Boltzmann distribution from the thermal “Brownian” motion (mechanical) and as a sensor that relies on the change in the index of refraction (optical) with a noise floor of few nK and a dynamic response time of few µs; and 2) a chip-scale Johnson Noise thermometer—the first user-friendly thermodynamic thermometer. We envision combining these devices with a variety of other sensors on a standard platform in a multiplexed network, creating a nanoscale, multi-function thermodynamic sensor, with broad-ranging applications in advanced manufacturing.

Topic: Metrology and the Consequences of Bad Measurement Decisions
Speaker: Scott Mimbs, A2LA Trainer and former director of NASA MetCal Program

Abstract:  Metrology is the science of measurement.  Measurements, in the simplest terms, provide the data used to make decisions.  Measurement-based decisions are present in almost every aspect of our lives, yet the decision process many times overlooks the potential for negative consequences.  Bad measurement data can lead to bad decisions.  Although many times insignificant, the negative consequences of bad measurement-based decisions can be catastrophic to individuals or corporations. For example, a faulty forensic test can lead to the incarceration of an innocent person, or a poor design specification can lead to failures resulting in accidents, deaths, and monetary losses in the billions of dollars, or an improperly calibrated medical device can lead to the death of a patient.
No modern industry is exempt from the negative consequences of bad measurement-based decisions.  The development of safe, reliable, cost-effective products, testing, and services require the inclusion of all aspects of metrology into a Quality Management System (QMS).  There are three essential elements that provide “good” measurement data: measurement requirements, calibration of equipment, and measurement processes.  Although calibration services are the most recognized element, failures in the measurement requirement and process elements are generally more costly in terms of money and product/mission success.  For measurements to sufficiently support decisions, all three aspects of metrology must be adequately addressed in the QMS.  
This presentation demonstrates metrology’s influence throughout the lifecycle and then, through factual case studies, illustrates the negative consequences when one or more of metrology’s elements fail.

Learning Objectives:
  1. Understand how measurement-based decisions flow through the product life-cycle.  
  2. Understand how measurement decision risk can translate to product risk.
  3. Identify the three essentials elements of “good” measurement data. 
08:00 A.M.      Networking/Coffee/Panera Bread
08:15 A.M       Introduction Presentation
08:30 A.M.      Thermal Measurement Challenges in Advanced Manufacturing and the Quantum SI, Greg Strouse
09:45 A.M.      Discussion: Questions & Comments
10:00 A.M.      Morning Break & Networking
10:30 A.M.      Metrology and the Consequences of Bad Measurement Decisions, Scott Mimbs
11:45 A.M.      Discussion: Questions & Comments
12:00 P.M.      Lunch Break
01:00 P.M.      Networking
01:30 P.M.      TBD, Greg Strouse
02:45 P.M.      Discussion: Question & Comments

03:00 P.M.      Meeting Discussion & Closing
03:30 P.M.      Meeting End

     Meeting Registration            Student Registration Form      Presenter Registration Form 

Trouble registering online? Please call the business office at 303-440-3339 or email info@ncsli.org and we will register you!

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