Unique Metrology at Southern Research
Speaker: James Tucker, Southern Research
Abstract: In order to achieve lab operation efficiency and repeatability of the results, the measurement automation approach to data collection is the next logical step often taken after the manual measurement and data collection process has been vetted out. For the calibration or testing laboratories, where measurement automation is not standardized or non-existent, the task of selecting suitable automation platform can be overwhelming due to various commercial solutions already available on the market. These solutions range from simple instrument automation to complete portfolio of test executive, asset management, accreditation and compliance, customer order processing, marketing and sales forecast management, etc. The goal of this presentation is not to elaborate on the complexity and powerful programming capabilities of the National Instruments LabVIEW or TestStand software but rather to focus on its simplicity of rapid automation development to fill in the gaps or enhance the current automation process in the laboratory.
Abstract: Due to its involvement in space science missions such as Chandra, GOES, JWST (James Webb Space Telescope, SWOT, and others, as well as pursuing state-of-the-art material testing, Southern Research has developed several unique metrology capabilities. An overview of some of the more interesting developments including DIC (Digital Image Correlation), Optical Strain Sensing, precision angle measurement, and at least two unique applications of displacement measuring interferometry will be presented. The talk will also include a live demonstration of nanometer displacement measurement using Southern Research engineered and patented technology.
Simplistic Approach to Measurement Automation in the Calibration or Test Laboratories
Speaker: Slavik Moskalets, National Instruments
High Temperature Measurement and Traceability
Speaker Name: Frank E. Liebmann, Fluke Calibration
Abstract: Temperature measurement at room temperatures is challenging. However, there are many well-established methods and equipment to make accurate measurements. High temperature measurements present a whole different set of challenges. Much of this is due to the upper temperature limits of available equipment being oftentimes well below 1000 °C. This being said, there are less well-established methods to measure temperature and establish traceability to the SI at these higher temperatures.
This presentation covers the basics of temperature traceability to the SI including the upcoming changes to the definition of the kelvin on May 20, 2019. It speaks to the current ITS90 definition, especially as it pertains to temperatures above the silver fixed-point. New proposed fixed points are discussed. Also included are heat sources, thermocouples and radiation thermometers available for this type of work.
High-Accuracy and High-Value Parts Manufacturing: The case for a true lab-grade CMM
Speaker: Alan Jackson, Mitutoyo Corporation
Abstract: Coordinate measuring using the world’s most accurate CMM will be examined. Environmental factors and accuracy will be covered along with the next-generation software that generates code from a solid model.
The Redefinition of the SI – What Does it Mean for Your Lab?
Speaker: Helga Alexander, International Accreditation Service (IAS)
Abstract: The redefinition of the International System of Units (SI) will go into effect on World Metrology Day on May 20, 2019. This presentation will summarize the history of the SI and the reasons behind the decision made unanimously by the international metrology community to redefine the SI. You will also learn whether and how this might affect your calibration or test results.
The meeting is open to US Citizens and Non-Citizens. This section meeting will conclude with a tour of Southern Research’s Materials Testing Laboratories. Due to the nature of work conducted at Southern Research, this tour is only open to US Citizens and Permanent US Residents, who can proof their citizenship/permanent residency status at the time of joining the tour. Acceptable documentation for proof of eligibility is one of the following:
- US Passport
- US Passport Card
- US Permanent Resident Card (“Green Card”)
- Government personnel Common Access Card (CAC)
- A letter from your employer’s HR or Security Office (on letterhead) stating that the employer has verified US Citizenship or Permanent Residency
- Original or certified birth certificate and a government issued photo identification or other State or federally issued identification
Unfortunately you will not be allowed to participate in the tour if you do not have the appropriate documentation with you.