Southern US Region -
Atlanta Section (1221)

NCSLI Atlanta Section Meeting
Thursday, September 12, 2019
Please Join us!

     Meeting Registration            Student Registration Form      Presenter Registration Form 

Meeting Overview

The NCSLI Atlanta Section meeting will provide insights on various topics relevant to all who perform physical measurements or rely on physical measurement results for making decisions. See the agenda for presentation specifics. The meeting will include a tour of the Applied Technical Services “Superlab” in Marietta, GA. Please see documentation requirements for tour in the Additional Information section of this announcement.

Meeting Contact
Beverly Garcia
JM Test Systems, Inc.

Meeting Date & Time
Thursday, September 12, 2019
8:30 AM - 4:00 PM

Meeting Host & Location
Applied Technical Services
1049 Triad Court
Marietta, GA, 30062

Meeting Sponsors
Applied Technical Services
Southern Marketing Associates

Cost to Attend
Complimentary NCSLI Training

Additional Information
The meeting is open to US Citizens and Non-Citizens. Due to the nature of work conducted at Applied Technical Services, this tour is only open to US Citizens and Permanent US Residents, who can proof their citizenship/permanent residency status at the time of joining the tour.  Acceptable documentation for proof of eligibility is one of the following:

1. US Passport
2. US Passport Card
3. US Permanent Resident Card (“Green Card”)
4. Government personnel Common Access Card (CAC)
5. A letter from your employer’s HR or Security Office (on letterhead) stating that the employer has verified US Citizenship or Permanent Residency
6. Original or certified birth certificate and a government issued photo identification or other State or federally issued identification

Unfortunately, you will not be allowed to participate in the tour if you do not have the appropriate documentation with you.

Meeting Speakers
Understanding and Navigating TAR's and TUR's Measurement Uncertainty
Jeff Cook/Brian Miles, Applied Technical Services
Abstract Pending

Topic: Common Errors and Innovations with Drywell Calibrators
Chris Christofferson, Additel Corporation

Abstract: In this presentation, Chris will discuss common errors that users may not be aware of when using Drywell Calibrators. He will discuss when you need to use an external reference thermometer and when you might not need to. He will also show new innovations in Drywell manufacturing to improve productivity and throughput. This will be an open discussion where you can ask all the questions you would like.

Topic: Vibration Calibration: Methods of Accelerometers and Considerations for Uncertainty
Patrick Timmons, the Modal Shop

Abstract: This presentation will give an overview of the calibration methods used for accelerometers and the associated standards. Typical failure modes of sensors and the efficacy of the methods in observing these failures will be presented. In calibration, one of the primary contributors to uncertainty is the directionality of the motion of the sensor stack during sinewave excitation. The relationship between the sensor characteristic of transverse sensitivity and the calibration exciter characteristic of transverse motion will be detailed. Target audience is beginner to intermediate level.

Topic: Hardness Tester Innovations and Calibrations
Rich Wismer, Ametek Sales Manager (North America) for Newage, Chatillon, and Lloyd Product Lines
Abstract: Pending

Topic: Coordinate Measuring Machines Calibration Practices
Tony Almeda, Mitutoyo Sales Representative
Abstract: Pending

Topic: Maintaining Compliance With Your Computerized LIMS
Mike Linn, Indysoft
Abstract: Laboratory generated data and the control of information is critical to laboratory operations. From the collection of measurement data to the reporting of operational key performance indicators, laboratory managers are challenged to implement systems to manage their information. This presentation will discuss options for lab managers to comply with the various regulatory and accreditation requirements for laboratory information management systems with a focus on ISO/IEC 17025:2017 Section 7.11.

Meeting Agenda
8:15AM – 8:45 AM             Registration, Networking, Breakfast
8:50 AM - 9:00 AM             Welcome To ATS, Logistics, NCSLI Overview (Applied Technical Services/B. Garcia, NCSLI)
 9:00 AM – 10:00 AM         Jeff Cook/Brian Miles, Applied Technical Services
10:00 AM - 10:45 AM        Dallen Baugh, Additel Corporation
10:45 AM – 11:00              Break
11:00 AM - 11:45 AM        Pat Timmons, The Modal Shop
11:45 AM - 12:15 PM        Lunch, Networking (lunch provided by Applied Technical Services)
12:15 PM - 1:15 PM          Tour of Applied Technical Services Testing Lab
1:30 PM - 2:15 PM            Rich Wismer, Ametek Measurement & Calibration Technologies
2:15 PM – 3:00 PM           Tony Almeda, Mitutoyo
3:00 PM – 3:45 PM           Mike Linn, Indysoft
3:45 PM – 4:00 PM           ATS/NCSLI Conclusion and Raffle
     Meeting Registration            Student Registration Form      Presenter Registration Form 

Trouble registering online? Please call the business office at 303-440-3339 or email and we will register you!

NCSLI Local Region Meeting Survey
The purpose of this survey is to determine what topics, interests, and presentation styles are of value to our meeting attendees.

Past Meetings and Events

Atlanta Section Meeting, Thursday April 2, 2015
The Atlanta section held its spring meeting on April 2, in Alpharetta, Georgia hosted by Trescal, Inc. Our goal was to bring Atlanta’s metrology leaders together to share ideas and best practices and to expose attendees to experts in fields relative to test and measurements.
Section Meeting Review (.PDF)

Atlanta Section Coordinator