NCSLI Atlanta Section Meeting
Thursday, September 12, 2019
Please Join us!
Meeting Registration Student Registration Form Presenter Registration Form
The NCSLI Atlanta Section meeting will provide insights on various topics relevant to all who perform physical measurements or rely on physical measurement results for making decisions. See the agenda for presentation specifics. The meeting will include a tour of the Applied Technical Services “Superlab” in Marietta, GA. Please see documentation requirements for tour in the Additional Information section of this announcement.
JM Test Systems, Inc.
Meeting Date & Time
Thursday, September 12, 2019
8:15 AM - 4:00 PM
Meeting Host & Location
Applied Technical Services
1049 Triad Court
Marietta, GA, 30062
Applied Technical Services (Facility Tour and Lunch)
Southern Marketing Associates
Cost to Attend
Complimentary NCSLI Training
The meeting is open to US Citizens and Non-Citizens. Due to the nature of work conducted at Applied Technical Services, this tour is only open to US Citizens and Permanent US Residents, who can prove their citizenship/permanent residency status at the time of joining the tour. Acceptable documentation for proof of eligibility is one of the following:
1. US Passport
2. US Passport Card
3. US Permanent Resident Card (“Green Card”)
4. Government personnel Common Access Card (CAC)
5. A letter from your employer’s HR or Security Office (on letterhead) stating that the employer has verified US Citizenship or Permanent Residency
6. Original or certified birth certificate and a government issued photo identification or other State or federally issued identification
Unfortunately, you will not be allowed to participate in the tour if you do not have the appropriate documentation with you.
Topic: Understanding and Navigating TAR's and TUR's Measurement Uncertainty
Jeff Cook and Brian Miles, Applied Technical Services
In this presentation, Jeff will discuss the difference between Test Accuracy Ratios And Test Uncertainty Ratios. Open topic on how to address with customers and purchase orders. We will have more of an open discussion than a lecture with input from everyone on how this affects the calibration World.
Brian will discuss the influences that environmental conditions have on measurement values. We will discuss the importance accounting for temperature, humidity, and pressure when making wind flow measurements. We will also discuss the importance of accounting for temperature overall when making various measurements in chemistry, conductivity, and velocity.
Jeff has worked in the calibration field for over 30 years. 6 years with Georgia Tech Research Institute calibration lab. 24 years with Applied Technical services calibration lab. Working with all aspects of field service and in labs electronic/environmental calibrations. Corporate Development of ISO/IEC 17025 uncertainty budgets, ISO/IEC 17025 audit support for multiple locations/disciplines.
Brian has been with ATS for twelve years, seven of which I have been the Environmental Calibration Lab Supervisor. Before that he spent ten years in the US Navy working electronics on various aircraft platforms. Four of those years were spent working as the calibration lab supervisor on the Naval Air Facility at Andrews Air Force Base. He holds a certificate as a Certified Quality Technician and previously as a Certified Calibration Technician.
Topic: Common Errors and Innovations with Drywell Calibrators
Chris Christofferson, Additel Corporation
Abstract: In this presentation, Chris will discuss common errors that users may not be aware of when using Drywell Calibrators. He will discuss when you need to use an external reference thermometer and when you might not need to. He will also show new innovations in Drywell manufacturing to improve productivity and throughput. This will be an open discussion where you can ask all the questions you would like.
Topic: Vibration Calibration: Methods of Accelerometers and Considerations for Uncertainty
Patrick Timmons, the Modal Shop
Abstract: This presentation will give an overview of the calibration methods used for accelerometers and the associated standards. Typical failure modes of sensors and the efficacy of the methods in observing these failures will be presented. In calibration, one of the primary contributors to uncertainty is the directionality of the motion of the sensor stack during sinewave excitation. The relationship between the sensor characteristic of transverse sensitivity and the calibration exciter characteristic of transverse motion will be detailed. Target audience is beginner to intermediate level.
Patrick J. Timmons is a calibration systems engineer based out of Cincinnati, Ohio. Patrick graduated from Michigan Technological University in 2009 with a Bachelor of Science in mechanical engineering. Joining The Modal Shop Inc. in 2010, Patrick worked to develop the linear motor-based vibration shaker for low frequency long stroke calibration applications. Patrick currently serves as engineering development and support within TMS calibration product group. Within the modal shop, his area of work ranges from calibration exciter hardware testing and development, uncertainty analysis, and dynamic vibration simulation, to software testing and data analysis. Patrick serves as a member of the ISO Technical Committee 108 Working group 34 on vibration calibration and works externally to educate many in the calibration metrology community on topics of transducers, calibration, vibration, shock, and dynamic pressure.
Topic: Hardness Tester Innovations and Calibrations
Rich Wismer, Ametek Sales Manager (North America) for Newage, Chatillon, and Lloyd Product Lines
Rich began his career as an Apprentice Tool maker and spent 12 years in the shop specializing in Custom Machines. He spent 30 plus years selling gaging equipment ranging from hand tools to CMM’s, Surface finish testing, Roundness and Materials testing. Rich is also involved in Field service and calibration of test equipment. He is a member of ASTM and has sat on committees for surface finish and metals hardness.
Topic: Coordinate Measuring Machines Calibration Practices
Tony Almeda, Mitutoyo Sales Representative
Abstract: Best CMM calibration practices. This presentation will examine the difference of CMM linear accuracy and Volumetric accuracy. Why squareness is very important for the CMM calibration. Which artifacts Mitutoyo used to calibrate CMM’s and other important checks and adjustments for a CMM.
Tony has been in Metrology Field for 33 years. Of those, 5 years were in repair and calibration of small tools and 20 years calibrating CMM, Form and Vision Systems for Mitutoyo.
Topic: Maintaining Compliance With Your Computerized LIMS
Mike Linn, Indysoft
Abstract: Laboratory generated data and the control of information is critical to laboratory operations. From the collection of measurement data to the reporting of operational key performance indicators, laboratory managers are challenged to implement systems to manage their information. This presentation will discuss options for lab managers to comply with the various regulatory and accreditation requirements for laboratory information management systems with a focus on ISO/IEC 17025:2017 Section 7.11.
Raised in the Birmingham area, Mike started his metrology career as an electronics PMEL technician in the US Navy serving aboard the aircraft carrier USS Midway and the submarine tender USS McKee. After 6 years of service he left San Diego for Denver, where he worked for Colorado Data Systems as a testing and repair technician on the CDS bus and VXI instrument on a card systems. Upon acquisition by Tektronix, and the subsequent transfer of manufacturing to Oregon, he moved back to Birmingham where he worked as a calibration, repair and programming technician specializing in automated weighing systems. In 1997 he was hired by Johnson Controls as an onsite metrologist for their new technology offering. For the next 23 years, he worked for JCI and later through acquisition CBRE. He served in various roles, including technical manager and quality manager for their 17025 accredited corporate metrology group. He helped build it from a 3 man, primarily truck-based operation, to a $5M+ business with a 25-page scope of accreditation. He now works as in-house corporate metrologist for IndySoft Corporation, a premier supplier of test equipment asset management and calibration software. His duties include guiding the direction of the core product, consulting with customers in best practices and with his programming background, to act as a translator between customers who speak metrology and the software developers. His more than 30 years in metrology at all levels and disciplines have made him a valuable member of several NCSLI committees, a technical advisor for the National Association for Proficiency Testing and a member of the Executive TAG for ANAB. Outside of work he enjoys tournament bass fishing and blacksmithing.
8:15 AM - 8:45 AM Registration, Networking, Breakfast
8:50 AM - 9:00 AM Welcome To ATS, Logistics, NCSLI Overview (Applied Technical Services/B. Garcia, NCSLI)
9:00 AM - 10:00 AM Jeff Cook and Brian Miles, Applied Technical Services
10:00 AM - 10:45 AM Chris Christofferson, Additel Corporation
10:45 AM - 11:00 AM Break
11:00 AM - 11:45 AM Patrick Timmons, The Modal Shop
11:45 AM - 12:15 PM Lunch, Networking (lunch provided by Applied Technical Services)
12:15 PM - 1:15 PM Tour of Applied Technical Services Testing Lab
1:30 PM - 2:15 PM Rich Wismer, Ametek Measurement & Calibration Technologies
2:15 PM - 3:00 PM Tony Almeda, Mitutoyo
3:00 PM - 3:45 PM Mike Linn, Indysoft
3:45 PM - 4:00 PM ATS/NCSLI Conclusion and Raffle