Topic: : Dynamic Sensor Calibration and Characterization
Mike Dillon, The Modal Shop
Abstract: :In addition to a brief overview of accelerometer calibration, the presentation will share the techniques PCB uses to determine many of the other sensor specifications we publish. We also describe the specification verification techniques we use, in addition to acceptance testing.
Topic: Maintaining Compliance with your Computerized LIMS
Mike Linn, Indysoft
Abstract: Laboratory generated data and the control of information is critical to laboratory operations. From the collection of measurement data to the reporting of operational key performance indicators, laboratory managers are challenged to implement systems to manage their information. This presentation will discuss options for lab managers to comply with the various regulatory and accreditation requirements for laboratory information management systems with a focus on ISO/IEC 17025:2017 Section 7.11.
Topic: Measurement of RF power using Calorimetric Method
Speakers’ Name: Andy Brush, Tegam
Abstract: Traceability of measurement of RF power on the order of several Watts to kilowatts has historically been accomplished using either coupler methods (Bramall), or calorimetric methods. My talk will cover the challenges involved in building calorimeters of up to 10 kW, and using these calorimeters to calibrate couplers and other commercial through-line sensors. We will look into sources of uncertainty and projected uncertainty budgets for primary calibrations. Using best practices, it is possible to calibrate stable sensors with low reflection with uncertainty with uncertainties better than 0.5 %.
8:30 – 9:00 Registration, breakfast
9:00 -9:15 Welcome, introductions and announcement of new Huntsville Section Coordinator Kirk Foster
9:15 – 10:00 Andy Brush, Tegam, Measurement of RF power using Calorimetric Method
10:00 – 10:15 VIDEO NIST SI Redefinition
10:15 – 11:00 Mike Linn, Indysoft, Maintaining Compliance with your Computerized LIMS
11:00 -11:15 Break
11:15 – 12:00 Adam Croan, National Instruments
12:00 – 1:00 Group Photo, Lunch “dutch treat” Pinecrest dining room
1:00 – 2:00 Mike Dillon, The Modal Shop, Dynamic Sensor Calibration and Characterization
2:00 – 2:15 VIDEO TBA
2:15 – 3:15 Heather Wade, Heather Wade Group, LLC, How to Determine Equipment Accuracy for Test Method Specs
3:15 – 3:30 Meeting wrap-up, door prizes, adjourn