NCSLI Tennessee Section (1224)

NCSLI Tennessee Section Meeting
Monday May 20, 2019
Please Join Us!

         Meeting Registration                 Presenter Registration Form       Student Registration Form

Meeting Overview:
The NCSLI Tennessee Section will meet in celebration of World Metrology Day on May 20, 2019 at the Oak Ridge National Laboratory. Three expert presenters from NIST's Kibble Balance effort will share the journey to redefine the Planck's constant, and the resulting redefinition of the kg. They will also present on the dissemination of the quantum resistance values and NIST's efforts to develop a graphene-based quantum resistance standard. Please join us to celebrate World Metrology Day!
*An access pass is required to enter the facility. Registrants will be contacted for information necessary to set up access passes. Registrations must be submitted by May 16 for US citizens and May 9 for non-citizens.

NCSLI Tennessee Section Coordinators: 
Michael Duncan
Oak Ridge National Laboratory
865-574-7349
duncanml@ornl.gov 
Vickie Hendrickson
Oak Ridge National Laboratory
865-241-4679
hendricksovl@ornl.gov

Meeting Date & Time:
May, May 20, 2019
8:00 AM to 4:00 PM

Cost to attend meeting:
NCSL International
Complimentary Section Meeting

 
 
Meeting Location:
Oak Ridge National Laboratory
1 Bethel Valley Rd
BLDG 5510A
Oak Ridge, TN 37830

Google Maps

More Information:
An access pass is required to enter the facility. Registrants will be contacted for information necessary to set up access passes. Registrations must be submitted by May 16 for US citizens and May 9 for non-citizens.

Meeting Speakers:

Topic: The Revised SI (vol. 1) and the Redefinition of the Kilogram
Speaker: Leon Chao, National Institute of Science and Technology (NIST)

On May 20, 2019, World Metrology Day, the International System of Units (SI) will undergo a paradigm shift from a set of seven base units to a set of seven base fundamental constants. This talk will highlight the evolution of metrology and three of seven SI units/constants (kilogram, meter, second) with an emphasis on the redefinition of the kilogram in terms of a fixed value of the Planck constant, h, using an instrument called a Kibble balance.

Topic: The Revised SI (vol. 2) and Dissemination of the Ohm
Speakers: Alireza Panna and Shamith Payagala, National Institute of Science and Technology (NIST)

The redefinition and consequently the revision to the present International System of Units (SI) heralds a new era in measurement which will be traceable to fundamental constants. This talk will briefly describe the revisions made to four of seven SI units (kelvin, mole, candela, and ampere) and its implications. The impact to electrical metrology in terms of the SI derived units of electric potential difference and electric resistance will be presented with an emphasis on resistance. Finally, a description of various scaling techniques to decade resistance levels based on both cryogenic and non-cryogenic current comparator bridges will be presented along with a discussion of the advantages of various scaling paths to describe the dissemination of the Ohm in the revised SI.

Topic: Graphene based table-top Quantum Hall Resistance Standard
Speaker: Shamith Payagala, National Institute of Science and Technology (NIST)

At present, most QHR standards are based on AlGaAs/GaAs heterostructures and rely on the integer quantum Hall effect (QHE) as the foundation for traceability of the ohm (SI unit). Although the effect is well-tested, accessing the QHR with an uncertainty near one part in 109 requires cumbersome and expensive infrastructure to reach low temperatures (0.3 K to 1.6 K) and high magnetic fields (6 T to 12 T), ultimately limiting the efficiency of calibrations and traceability. Graphene, the two-dimensional, honeycomb lattice of carbon atoms, exhibits the QHE at higher temperatures (4 K) and lower magnetic fields (5 T) than in gallium arsenide (GaAs), allowing the operation of epitaxial graphene (EG) QHR devices in cryogen-free refrigeration systems fitted with compact superconducting magnets. This concept motivates research in optimizing EG devices for metrology to promote accessibility to the QHR. Versatility and low operating cost facilitate graphene based QHR systems to be used in metrology labs beyond National Metrology Institutes (NMIs) and a handful of industrial laboratories. We have demonstrated that EG devices can potentially be used up to 10 V, where the precision of DCC room-temperature bridges can provide turn-key resistance traceability for the most demanding applications with a relative uncertainty of 10-8.

Current and Future States of Realization of the SI Units at ORNL
Speakers: Mike Duncan, Greg Strickland, Joe Keck and Brian Sizemore

ORNL currently realizes many of the SI units via natural constants, while some are still realized using physical artifacts. This presentation will discuss the current state of realization of the SI units at ORNL and anticipated future realizations based on natural constants, thereby eliminating the dependency on physical artifacts, and their tendency to drift, for all SI units. Impacts and opportunities created by the presence of these realizations locally on calibration laboratories will also be discussed. The presentation will be followed by tours of the ORNL Metrology facilities where attendees will have the opportunity to see the equipment and methods used to realize the SI units locally in Oak Ridge.
 
Meeting Agenda

8:00 AM - 8:30 AM       Registration 
     
8:30 AM - 8:45 AM       Orientation and Introduction with NCSLI Section Coordinator Mike Duncan

8:45 AM - 9:15 AM       History and Current Research at ORNL, Mike Duncan, Oak Ridge National Laboratory

9:15 AM - 10:00 AM     The Revised SI (vol. 1) and the Redefinition of the Kilogram, Leon Chao, NIST 

10:00 AM - 10:20 AM   Break    

10:20 AM - 11:05 AM   The Revised SI (vol. 2) and Dissemination of the Ohm, Alireza Panna, NIST 

11:05 AM - 11:50 AM   Graphene based table-top Quantum Hall Resistance Standard, Shamith Payagala, NIST 

11:50 AM - 12:05 PM   Picture  

12:05 PM - 1:05 PM     Lunch   

1:05 PM - 1:50 PM       Current and Future States of Realization of the SI Units at ORNL, Mike Duncan, Greg Strickland,
                                       Joe Keck, and Brian Sizemore 

1:50 PM - 2:05 PM      Tour Instructions and Closing, Mike Duncan, Oak Ridge National Laboratory

2:05 PM - 3:35 PM      Tour of ORNL Metrology Labs

         Meeting Registration                 Presenter Registration Form       Student Registration Form

Trouble registering online? Please call the business office at 303-440-3339 or email
info@ncsli.org and we will register you!

Past NCSLI Tennessee Section Meetings



Tennessee Section Meeting, Tuesday May 1, 2018
The NCSLI Tennessee Section held its spring meeting on May 1, 2018 at the Oak Ridge National Laboratory (ORNL) in Oak Ridge, Tennessee with 52 people in attendance. There were several outstanding presentations we began with “The New ISO/IEC 17025” Standard” by Internal Accreditation Service’s (IAS) Helga Alexander. The next was a presentation titled “Designing Flowmeter Calibration Test Plans” by CEESI’s Tom Kegel. After that the audience watched a presentation called “Calibration Issues related to Surface Finish and Standardization” by Mitutoyo’s Jeremy Adcox. Fluke’s Scott Peterson spoke on “Advantages of Calibration Automation & Asset Management Software.” The last talk was titled Tennessee “Primary-Level Metrology Capabilities at the Oak Ridge National Laboratory (ORNL)” by ORNL’s Greg Strickland, Joe Keck and Mike Duncan. To close out the meeting, the Oak Ridge National Laboratory’s metrology staff hosted tours of the ORNL Metrology laboratory, the historic ORNL Graphite Reactor and the ORNL Exoscale Computing Center. Lunch for all attendees was sponsored by Mitutoyo America.
Section Meeting Review (.PDF)

Tennessee Section Coordinator

 

NCSLI Local Region Meeting Survey

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