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This year NCSL International will offer 27 tutorials in conjunction with the Annual Workshop & Symposium. The registration fee for the tutorials is not included in the Conference fees.

August 2, 3 ,7, 2008

Tutorial Registration Form 

Refreshments are included.

Saturday, August 2: 8:00 AM - 5:00 PM (Full Day)
  T1 Balance Calibration and Uncertainty
Val Miller & Mark Ruefenacht

 
Saturday, August 2: 8:00 AM - 5:00 PM (Full Day)
  T3 Business Practices and Improvements - Preparing for the Future
Carroll Brickenkamp, Ernest Garner, Sharrill Dittmann

 
Saturday, August 2: 8:00 AM - 12:00 PM (Half Day)
  T4 Fundamentals of Calibration in Dimensional Metrology
Amosh Kumar, Jim Salsbury

 
Saturday, August 2: 8:00 AM - 12:00 PM (Half Day)
  T5 Humidity Calibration Tutorial
Jeff Bennewitz and Gregory Scace

 
Saturday, August 2: 8:00 AM - 12:00 PM (Half Day)
  T6 Establishing a "Delay Dating" Program
James Smith

 
Saturday, August 2: 8:00 AM - 12:00 PM (Half Day)
  T7 Measurement Uncertainty Made Easy
Georgette Macdonald, Mike Ouellette

 
Saturday, August 2: 1:00 PM - 5:00 PM (Half Day)
  T8 CMMs in the Calibration Lab
Jim Salsbury, Amosh Kumar

 
Saturday, August 2: 1:00 PM - 5:00 PM (Half Day)
  T9 Running an Effectve Laboratory - Measuring Performance
Malcolm Smith

 
Saturday, August 2: 1:00 PM - 5:00 PM (Half Day)
  T10 Introduction to Bayesian Uncertainty Analysis Using WinBUGS
William Guthrie, Blaza Toman

 
Sunday, August 3: 8:00 AM - 5:00 PM (Full Day)
  T11 Meeting ISO/IEC 17025:2005 to Achieve Accreditation for Your Laboratory
Dana Leaman

 
Sunday, August 3: 8:00 AM - 5:00 PM (Full Day)
  T12 Analysis of Quality Control Data for Laboratory Technicians and Managers
Dilip Shah

 
Sunday, August 3: 8:00 AM - 12:00 PM (Half Day)
  T13 Fundamentals of Temperature Calibration
Mike Coleman, Tom Wiandt

 
Sunday, August 3: 8:00 AM - 12:00 PM (Half Day)
  T14 Very Low Pressure Calibration
Karl Kurtz, Mike Bair

 
Sunday, August 3: 8:00 AM - 12:00 PM (Half Day)
  T15 Introduction to NCSLI RP-12-2008 (Determining and Reporting Measurement Uncertainties)
Suzanne Castrup

 
Sunday, August 3: 8:00 AM - 12:00 PM (Half Day)
  T17 Gas Flow Workshop
Robert DeRemer

 
Sunday, August 3: 8:00 AM - 12:00 PM (Half Day)
  T18 Good, Bad, or Indeterminate: Who Makes the Call?
David Deaver

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T19 Temperature Calibration Uncertainty Analysis
Mike Coleman, Tom Wiandt

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T20 Very Low Pressure Applications
Karl Kurtz, Mike Bair

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T21 Meeting the Z540.3 False Accept Risk Requirement
Howard Castrup

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T22 Force Calibration: Methods and Uncertainties
Mike Tovey

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T23 Monte Carlo - Uncertainty Made Easy
Alan Steele, Rob Douglas & Georgette Macdonald

 
Sunday, August 3: 1:00 PM - 5:00 PM (Half Day)
  T24 Measurement of Customer Satisfaction: An application of “soft” metrology
Jean Claude Krynicki

 
Friday, August 8: 8:00 AM - 12:00 PM (Half Day)
  T26 Interval Analysis Concepts and Methods
Howard Castrup

 
Friday, August 8: 8:00 PM - 12:00 PM (Half Day)
  T27 A Quality Calibration Program for Biotech and Pharmaceutical Companies
Jay Bucher

 
 
Tutorial Registration Form

T1 Balance Calibration and Uncertainty

August 2, 2008 8:00 AM - 5:00 PM
Instructor: Val Miller & Mark Ruefenacht

This full-day tutorial will discuss the sources of weighing errors in analytical environments, methodologies for quantifying the errors, and computation of balance calibration uncertainty. Attention will be given to error sources, selection of standards, and various calibration and testing procedures used in the balance industry. Time will be spent in hands-on exercises calibrating a variety of balances, accumulating data, and developing uncertainty budgets. Compliance with pharmaceutical (FDA/ USP) and international requirements will be discussed. Methodologies for process measurement assurance techniques in analytical weighing will also be covered.

This tutorial is limited to 30 participants. (Laptop with spreadsheet capability and / or scientific calculator optional.)

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T3 Business Practices and Improvements - Preparing for the Future

August 2, 2008 8:00 AM - 5:00 PM
Instructor: Carroll Brickenkamp, Ernest Garner, Sharrill Dittmann

This full-day tutorial will focus on scenario planning for the high technology business of metrology. Metrology, the science of measurements, is frequently perceived, valued and characterized by metrologists as an end unto itself. This traditional and narrow view can become a barrier to the business side of metrology, impacting the productivity, profitability and competitiveness of users and clients of metrology organizations as well as the metrology provider. The first part of the tutorial will explore the impact of rapidly changing technology on today’s metrology organization, present the basic principles of scenario planning as a tool that will help keep it competitive in the future, and review a well-documented success in scenario planning. Using an interactive format, the second phase of the tutorial will look specifically at the application of scenario planning to virtual metrology organizations (as designed by the attendees) using parameters selected by the participants.
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T4 Fundamentals of Calibration in Dimensional Metrology

August 2, 2008 8:00 AM - 12:00 PM
Instructor: Amosh Kumar, Jim Salsbury

This tutorial provides an overview of calibration techniques and key issues in the field of dimensional metrology. All the major types of dimensional calibrations will be discussed. We will start by studying the calibration, use, and traceability issues of the standards used in the field, such as gage blocks, ring gages, optical flats, thread wires, and length standards. We will then discuss the calibration of the common small measuring tools such as micrometers, calipers, dial indicators, and height gages. We will then introduce the issues surrounding the site calibration, or field calibration, of major measuring instruments such as CMMs, roundness measuring machines, and optical comparators. In addition to presenting specific calibration methods, the bigger goal of the tutorial is on developing understanding of the principles behind the dimensional calibration methods thereby giving the attendee the necessary tools to extend the tutorial concepts to other types of calibrations. With that goal in mind, not only will recommended procedures be presented, but also optional methods, sources of errors and methods to reduce them, and techniques for estimating the uncertainty of measurement. The tutorial handouts will include example procedures, numerous pictures of techniques, and uncertainty budgets.
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T5 Humidity Calibration Tutorial

August 2, 2008 8:00 AM - 12:00 PM
Instructor: Jeff Bennewitz and Gregory Scace

Humidity calibration tutorial, information overview of basic humidity definitions, dew point, frost point, relative humidity and humidity accuracy uncertainty. Participants will practice humidity calculations and conversions using HumiCalc humidity conversion software. Humidity accuracy uncertainty calculations using HumiCalc with Uncertainty.
Humidity calibration technique using the 2 pressure humidity calibration standard. The instructor will demonstrate a typical calibration setup of a hygrometer and dew point instruments. Discussion of response time and calibration procedure using the 2 pressure humidity standard. Guest speakers from NIST and Vaisala Humidity Instrument Company.
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T6 Establishing a "Delay Dating" Program

August 2, 2008 8:00 AM - 12:00 PM
Instructor: James Smith

Delay Dating is an ever growing application within the Measurement, Metrology, Testing and Equipment Management disciplines; many times controversial, with no set governance the process can be daunting to establish, especially in the light of limited available reference information. This presentation and event sums up the series of NCSLI discussions & presentations focusing specifically on addressing the issue from a Scientific Methods base; evaluating the opportunities and establishing workable actions to initiate and grow an internal process while reducing the risk assumed. The tutorial provides both an overview and application process for developing or expanding an internal “Delay Dating” (DD) program. Emphasis is placed on differentiating the topic from calibration interval projects to what a DD program can do for your Test Equipment Management functions, Metrology flow & cycle time and support to your customer base of end users. The attendee will be provided with a Process Guide detailing the key features and action steps from initial concept through inventory review, experimental design, acceptance/ rejection and application. Additionally a base procedure/ format & management tools will be provided so the attendee can customize the application for specific work requirements and text. Summary of the key elements to be provide & discussed: • Specific Scientific Method flow • Value Stream Mapping for Inventory Analysis • Process Guide • Experimentation Guide • Base Acceptance Guide • Base Procedure Template • Historic Examples & Success stories • Utilization Tracking methodology and application to DD • Status of NCSLI RP (Recommended Practice) draft for DD applications
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T7 Measurement Uncertainty Made Easy

August 2, 2008 8:00 AM - 12:00 PM
Instructor: Georgette Macdonald, Mike Ouellette

Why is it important to express the uncertainty in measurement? Quite simply, there is no traceability in measurements that lack statements of uncertainty at every link of the traceability chain. For this and other reasons, ISO/IEC 17025 requires calibration laboratories, in particular, to provide estimates of uncertainty of their measurements using accepted practices. The instructor will discuss the basics for preparing uncertainty estimates for typical uncomplicated measurement processes. This approach is consistent with the GUM but it dispenses, wherever possible, with the algebraic notations, statistical jargon, arithmetic modeling, and differential calculus operations found in the GUM that perhaps encumber a person who requires no more than a simple, conservative estimate of the uncertainty in the result of a simple measurement process. For these situations, it will be shown that the mathematics is quite straightforward and that the actual challenge, if any, to estimating uncertainty in measurement is in defining the factors that affect the measurement; namely, in understanding the metrology. Participants will receive an example Excel spreadsheet for making simplified uncertainty calculations. The tutorial will include a group exercise. Participants should bring stationary and pocket calculators.
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T8 CMMs in the Calibration Lab

August 2, 2008 1:00 PM - 5:00 PM
Instructor: Jim Salsbury, Amosh Kumar

For the past 50 years, the use of coordinate measuring machines (CMMs) has continued to grow into new areas, and now we are seeing more and more CMMs being used in dimensional calibration labs. The original use of the CMM was for measuring large production workpieces where the CMM offered major savings in measurement time, ease of use, and flexibility. As CMMs have continued to get more and more accurate, we are seeing many CMMs being used for calibration purposes, not only for calibrating master workpieces and special gages, but also for the calibration of length gages, cylindrical masters, squares, and a variety of other traditional dimensional gages that have historically been checked using alternative methods. The purpose of this tutorial is to examine the use of the CMM in the calibration lab. The differences between CMM measurement methods and traditional methods will be discussed. The tutorial will cover using CMMs to measure manufactured workpieces, the inspection of special fixture gages, and the calibration of a variety of dimensional gages. The tutorial will also include a wide breadth of accuracy – ranging from part inspection on manual CMMs with uncertainty around 0.01” (0.25 mm) to high accuracy CMMs being used to measure length standards with an uncertainty under 10 millionths of an inch (0.25 micrometers). This tutorial will focus on techniques, understanding sources of errors, traceability, and the uncertainty of CMM measurements.
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T9 Running an Effectve Laboratory - Measuring Performance

August 2, 2008 1:00 PM - 5:00 PM
Instructor: Malcolm Smith

This tutorial will be of interest to owners, managers, and supervisors of calibration laboratories, both in-house and commercial. The tutorial will cover four areas where performance measurement is important in the running of a laboratory: productivity, finance, service levels and customer satisfaction. The range of measures that can be used to monitor performance in each of these areas will be discussed. Suggestions on how these measures might be used in practice will be reviewed. Examples of measurements, with discussion of their effectiveness and appropriateness for process improvement, will be given.
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T10 Introduction to Bayesian Uncertainty Analysis Using WinBUGS

August 2, 2008 1:00 PM - 5:00 PM
Instructor: William Guthrie, Blaza Toman

The recent draft of Supplement 1 to the Guide to the Expression of Uncertainty in Measurement introduced a method of uncertainty analysis based on propagation of probability distributions through an explicitly-specified measurement equation. The implementation is by direct Monte Carlo simulation. The Supplement states that its use of probability distributions is “generally consistent with the concepts of Bayesian statistics underlying the GUM”. The open-source software WinBUGS, intended for Bayesian analysis using Markov chain Monte Carlo methods, can also be used to implement the methods of Supplement 1. One advantage of using WinBUGS over other implementations is that measurement models can also be specified implicitly, which is often easier than specification of a measurement equation when the distribution of the data depends on the value of the measurand. This course will introduce the concepts underlying the Monte Carlo methods for propagation of distributions, illustrate the use of WinBUGS on simple measurement models, and then demonstrate its full capability for a case in which the data and measurand are interdependent. Hands-on examples will be run in class to give participants experience using WinBUGS, so participants must bring a laptop that can run programs designed for Microsoft Windows. WinBUGS will be provided to participants at the workshop.
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T11 Meeting ISO/IEC 17025:2005 to Achieve Accreditation for Your Laboratory

August 3, 2008 8:00 AM - 5:00 PM
Instructor: Dana Leaman

This full-day tutorial examines the requirements of ISO/IEC 17025:2005, General Requirements for the Competence of Testing and Calibration Laboratories. Topics will include particular focus on what is required by the standard with a clause-by-clause review and discussion of these requirements and how they can be economically implemented in your laboratory. An overview of the accreditation process will also be included during the course discussions.
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T12 Analysis of Quality Control Data for Laboratory Technicians and Managers

August 3, 2008 8:00 AM - 5:00 PM
Instructor: Dilip Shah

This full-day tutorial will address ISO/IEC 17025:2005 standard, which states: “5.9.1 The laboratory shall have quality control procedures for monitoring the validity of tests and calibrations undertaken. The resulting data shall be recorded in such a way that trends are detectable and, where practicable, statistical techniques shall be applied to the reviewing of the results. This monitoring shall be planned and reviewed and may include, but not be limited to, the following:…..” “5.9.2 Quality control data shall be analyzed and, where they are found to be outside pre-defined criteria, planned action shall be taken to correct the problem and to prevent incorrect results from being reported.” This full-day tutorial demonstrates how to collect and analyze quality control data in a laboratory in a systematic manner and assist in satisfying the additional requirements of the ISO/IEC 17025:2005 standard. The workshop is targeted for laboratory managers and technicians who are involved in maintenance of standards, test and calibration activities. Practical examples are demonstrated using a spreadsheet. Participants are provided a copy of the spreadsheet template. Please bring a scientific calculator for problem solving exercises.
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T13 Fundamentals of Temperature Calibration

August 3, 2008 8:00 AM - 12:00 PM
Instructor: Mike Coleman, Tom Wiandt

This presentation is a review of the fundamentals of temperature calibration. Topics include calibration equipment, calibration techniques, curve fitting issues, and the mathematics important to thermometry. Types of thermometers covered include platinum resistance thermometers, thermistors, thermocouples, and combined thermometer/readout systems. This segment is intended for those who are new to temperature calibration, those who need to validate what they already know, or those who just have some nagging questions that need to be answered.
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T14 Very Low Pressure Calibration

August 3, 2008 8:00 AM - 12:00 PM
Instructor: Karl Kurtz, Mike Bair

This course focuses on the special challenges of very low gauge and differential pressure calibration. Topics range from the fundamental concepts of pressure measurements to the unique practical issues encountered in hardware setups, data acquisition and the measurement process. The calibration influences that become dominant at very low pressure are analyzed. Hands on application of the material presented in this tutorial can be experienced in the afternoon tutorial –“Very Low Pressure Measurement Applications”.
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T15 Introduction to NCSLI RP-12-2008 (Determining and Reporting Measurement Uncertainties)

August 3, 2008 8:00 AM - 12:00 PM
Instructor: Suzanne Castrup

This half-day tutorial provides an overview of NCSLI RP-12-2008 “Determining and Reporting Measurement Uncertainties.” Attendees will be introduced to important uncertainty analysis principles and methods contained in this RP. Procedures and guidelines for applying these principles and methods will be discussed and illustrated.

This tutorial is intended for metrology and quality assurance personnel responsible for implementing uncertainty analysis methods and procedures.

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T17 Gas Flow Workshop

August 3, 2008 8:00 AM - 12:00 PM
Instructor: Robert DeRemer

The Gas Flow Workshop is intended to be an introductory level workshop. The main thrust of the workshop will be the comparison of volumetric flow meters and mass flow meters in gas measurement applications. Specific topics that will be covered will include explanations of the fundamental principles of operation of various types of flow meters, factors that influence when to choose a mass flow meter or a volumetric flow meter, how to interpret performance specifications, how the various types of meters are calibrated, and an example of measurement uncertainty.
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T18 Good, Bad, or Indeterminate: Who Makes the Call?

August 3, 2008 8:00 AM - 12:00 PM
Instructor: David Deaver

When calibration data is provided on a certificate, ISO 17025 requires a statement of the measurement uncertainty. In addition, if a statement of compliance with specifications is made, the uncertainty of measurement must be taken into account. Z540.3 requires the false accept risk to be less than 2% if a TUR of greater than 4:1 cannot be maintained. This tutorial will describe some practical ways to consider uncertainties and their associated false test decision risk when making in-tolerance or out-of-tolerance declarations.
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T19 Temperature Calibration Uncertainty Analysis

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Mike Coleman, Tom Wiandt

This presentation is a step by step review of the tools necessary to evaluate the uncertainties present in temperature calibrations. Topics include curve fitting errors, error propagation, error budgeting, TURs, and statistical process control. Also discussed will be pertinent fundamentals of uncertainty analysis as outlined in the Guide to The Expression of Uncertainty in Measurement (GUM). This segment is intended for those who are new to uncertainty analysis as well as those who are well versed but require further guidance or clarification.
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T20 Very Low Pressure Applications

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Karl Kurtz, Mike Bair

This course is intended to follow the NCSLI tutorial “Very Low Pressure Calibration”. Specific low pressure calibration applications are set up for discussion and hands on calibration training. Data taken during the hands on sections is analyzed and the uncertainties associated with the influences present in the calibration process are discussed in detail. Specific problems experienced by students either in their own labs or during the hands on section are discussed as time permits.
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T21 Meeting the Z540.3 False Accept Risk Requirement

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Howard Castrup

Clause 5.3 of ANSI/NCSL Z540.3, "Requirements for the Calibration of Measuring and Test Equipment," contains a requirement that limits the risk of incorrectly accepting out-of-tolerance equipment parameters to a maximum of 2%. Where the estimation of this risk is not feasible, the test uncertainty ratio (TUR) is required to be 4:1 or greater. This tutorial provides methods for computing this "false accept" risk and also gives guidelines for managing in-tolerance compliance decisions. The latter includes methods for developing test guardbands that correspond to specified risk levels. Also included are discussions of the impact of measurement reliability and measurement uncertainty on false accept risk and on computing and interpreting the fallback 4:1 TUR. This tutorial is intended for individuals with a need to develop and apply tools for the control of measurement decision risk, with special emphasis on compliance with Z540.3. Although some college level math will be employed, related concepts will be fleshed out to ensure comprehension by attendees with moderate mathematical training.
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T22 Force Calibration: Methods and Uncertainties

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Mike Tovey

Force calibration is a special discipline with many considerations not common to other areas of metrology. Often measurement uncertainties are underestimated due to the omission of significant error sources. Metrologists must consider both mechanical and electrical boundary conditions to achieve calibrations with low measurement uncertainties. Factors such as second order material responses, and interaction of undesired parasitic loading due to fixture characteristics, misalignment of load frame components, stiffness, etc. can have significant influence on the measurement result. This tutorial will cover the characteristics of force transducers, force calibration methods, force calibration standards (E74 and ISO 376) and measurement uncertainty models for primary standards, secondary standards and field transfer standards. The tutorial begins at a basic level and leads to discussion of more complex issues.
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T23 Monte Carlo - Uncertainty Made Easy

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Alan Steele, Rob Douglas & Georgette Macdonald

A new era is dawning in uncertainty analysis. A new tool is emerging to bypass many of its difficulties that have troubled practical metrologists. The new tool can harness experience from the laboratory to help analyze the uncertainty of any practical measurement equation. Starting from the uncertainties claimed for input quantities (which can still be tough to evaluate), Monte Carlo simulation can simplify the rest. The new Supplement-1 to the ISO-GUM gives formal recognition to building, exploring and validating metrological uncertainty budgets using Monte Carlo methods. In this tutorial, you will use Monte Carlo simulation for uncertainty analysis, using Excel macros for this purpose. You will get an open-source Excel Toolkit that converts difficult uncertainty analysis into an easy Monte Carlo exercise that will feel much like doing a real experiment. You will learn the fundamentals of Monte Carlo uncertainty analysis, and how to enter your own measurement equation (or equations) into the Toolkit, using Excel’s version of Visual Basic. Some familiarity with uncertainty analysis, MS Excel and BASIC is essential to getting the most from this course, but students from all backgrounds and with all levels of experience are welcome and encouraged to attend. Attendees should bring their own laptop with Excel installed, including full permission to access Excel’s Visual Basic programming environment. Excel from Office 2007 has a new user interface, and is not recommended for this Tutorial, since our demonstrations will be using earlier versions of Excel (all other versions, from Excel 97 on, are OK).
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T24 Measurement of Customer Satisfaction: An application of “soft” metrology

August 3, 2008 1:00 PM - 5:00 PM
Instructor: Jean Claude Krynicki

• What is customer satisfaction and how to measure it? • Available methods to gather satisfaction data • How to build a pertinent customer satisfaction study questionnaire? • Measurement process • Measurement uncertainties • Results interpretation and conversion into actionable items • More advanced methods • Inventory of resources Upon completion of this module the student will be able: • to design a customer satisfaction measurement tool, ? to perform a reliable interpretation of the result, • to design presentations for Management reviews, • to build a customer satisfaction dashboard
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T26 Interval Analysis Concepts and Methods

August 8, 2008 8:00 AM - 12:00 PM
Instructor: Howard Castrup

This half-day tutorial provides an overview of calibration interval analysis concepts and methods. Attendees will be introduced to risk analysis concepts, measurement reliability modeling methods, statistical interval analysis techniques, calibration interval objectives and potential interval analysis spin-offs such as equipment outlier identification. Concepts are illustrated using commercially available software and selected freeware. This tutorial is intended to provide quality and calibration managers, systems analysts, equipment managers and metrology engineers with a practical basis for selecting, developing, implementing and operating a calibration interval analysis system.
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T27 A Quality Calibration Program for Biotech and Pharmaceutical Companies

August 8, 2008 8:00 PM - 12:00 PM
Instructor: Jay Bucher

If a business (biotech, pharmaceutical, chemical, or any life science company) expects to be a player in its market segment, their product(s) must have the quality demanded by their customers. This can only be accomplished with test instruments that produce repeatable, accurate and traceable measurements and/or outputs. In the 21st Century, most industries have compliance standards (i.e. ISO 9000 or ISO 13485) or regulator requirements (QSR, cGMP, etc. for the FDA) that view calibration of test equipment as a top priority. It is common knowledge that the calibration function is one of the top three areas written up for non-compliance to ISO standards and QSR regulations. It isn’t enough to just calibrate a piece of test equipment anymore. Calibration procedures must be written and followed. Records for each and every calibration must be completed, signed, saved and archived. A written process must be in place for items that are found to be out-of-tolerance – and this is only the tip of the quality calibration program iceberg. Traceability, calibration standards, uncertainty budgets, calibration intervals, labels and the environment must also be documented. We will also review calibration management software, scheduling practices, training and continuous process improvements. This tutorial will cover the calibration requirements needed to meet and exceed the standards and regulations most industries must comply with to be productive in today’s fast paced, fiscally savy environment. The lessons learned from developing, implementing and managing a ‘Best in Class’ calibration program will be shared with the attendees. Examples of calibration procedures, records (electronic and hard copy) and interval analysis will help demonstrate how easy it is to have a quality calibration program at your own company, while saving time and money by not having to send all your test equipment out for calibration.
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