Directory of Standards Labs     Volunteer Roster     Committees     Job Search     Forums     Join NCSLI    
Home
Presidents' Message
Online Dues Payment
Membership
Welcome
Conference
Theme
VISA Processing Procedure
Exhibit Sales 2009
Abstract Submit
2008 Presentations
Management
Call for Papers
Future Conferences
Past Conferences
Accreditation
Calendar - Events
Calendar - Training
MyNCSLI
Measure Magazine
Metrologist Magazine
Region Events
Learning & Development
Metrology News
Resources
Publications
Streaming Video
Awards
Cubit Info
Forums
DRM FAQs
NCSLI Training Center
Metrology Jobs & Internships
Resume (Jobs & Internships)
Online Store
     

Abstract and Manuscript Management System - Abstract Detail

Main Menu | Abstracts
 
Speaker:
Title:
Topic Group:
E-mail:
Co-Authors:
Abstract: In the recent past X-ray computed tomography (CT) has been established as an additional sensor for coordinate measurement machines (CMM´s). To reach for high accuracy and traceable measurement results systematic deviations of CT measurements must be corrected. The deviations, commonly known as artifacts, are influenced by many different and varying factors like geometry and material of the workpiece, design of the CT-sensor and actual parameters of the X-ray components. This paper gives an overview about systematic deviations and deals with various approaches for correcting CT-artifacts. The different approaches are discussed and compared to each other. A method for correcting directly on the workpiece (Auto-correction) by the use of optical or tactile-optical sensors which also leads to traceable CT-measurements is described in detail. Measurement results using Auto-correction on a multisensor-CMM comprising a CT-sensor will be presented and compared to other results. In this context also actual approaches to establish standards for the specification, acceptance and reverification tests for CMM´s with CT-sensor are described.