Abstract and Manuscript Management System

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Abstract and Manuscript Management System - Abstract Detail
Main Menu \| Abstracts

Speaker:	James Olthoff
Title:	The 2008 Conference on Precision Electromagnetic Measurements - An Overview and Highlights
Topic Group:	Highlights from CPEM
E-mail:	james.olthoff@nist.gov
Co-Authors:
Abstract:	The 2008 Conference on Precision Electromagnetic Measurements (CPEM 2008) is the preeminent international conference for the dissemination of new research related to precision electromagnetic metrology. The conference was held this past June in Colorado, and for the first time was co-sponsored by NIST and by NCSL International. This year there were over 350 presentations by authors from 33 countries presenting results that spanned the most compelling topics in electrical metrology. This talk will give a bit of history of the CPEM, provide an overview of CPEM 2008, and present some of the technical highlights.