Abstract and Manuscript Management System

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Abstract and Manuscript Management System - Session Details

Abstracts | Schedule

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Speaker	Title
Dean Jarrett	Procedures for the Traceability of High Resistance Standards Using a Teraohmmeter
George Jones	Measurement Uncertainties in Resistance Scaling due to Power Loading Effects in Precision Resistors
Kenneth Kochav	Transformer Calibration at NRC Using Thompson’s Method