173.3 Statistical Process Control Methods

Committee Charter
Review the case for an RP on statistical process control (SPC) customized for metrology. If appropriate, develop a Recommended Practice documenting analytical methods and procedures for the statistical control of measurement processes and standards. The RP should develop and describe risk-based control limits, trend analysis, process compliance hypothesis tests, and traditional SPC metrics applications. Alternatively, distribute the methodologies within the other MPC RPs; in RP-1 for example, to determine calibration expiration dates.