Standards and Practices

170  Standards and Practices
171  Calibration System Resources
172  Glossary (Metrology Dictionary)
173  Metrology Practices 
       173-1  Calibration Intervals 
       173-2  Measurement Decision Risk 
       173-3  Statistical Process Control Methods 
       173-4  Measurement Decision Support 
       173-5  Measurement Uncertainty Analysis
174  Standards Writing Group (ACS Z540)
175  Dimensional
2013 - 2014 GOALS AND OBJECTIVES
  • Creating and updating NCSLI products and services that become value-added member benefits (may include, but is not limited to: publications, standards, procedures, articles, conference sessions, workshops, educational materials, and tutorials)
  • Encouraging national and international collaboration within committees
  • Promoting a goal of 100 % membership status for all participants will be sought within each committee; all committees will post agendas at least 30 days prior to each meeting and meeting minutes will be shared and posted on the NCSLI website within 30 days of each meeting
Committee Roster
 
PositionFull NameOrganizationWork Phone
171 - Calibration Systems ResourcesJames WachterMillennium Engineering & Integration Co.(321) 867-7392
172 - Glossary (Metrology Dictionary)Emil HazarianNaval Surface Warfare Center(951) 273-4902
173.1 - Calibration IntervalsMark KusterPantex Metrology(806) 477-4306
173.3 - Statistical Process Control MethodsHoward T. CastrupIntegrated Sciences Group(661) 872-1683
173.4 - Measurement Decision SupportHoward T. CastrupIntegrated Sciences Group(661) 872-1683
173.5 - Measurement Uncertainty AnalysisSuzanne CastrupIntegrated Sciences Group(661) 872-1683
174 - Standards Writing Group (ANS Z540)Stephen DotyNaval Surface Warfare Center(951) 273-4701
174 - Standards Writing Group (ANS Z540)Bob SternAgilent Technologies 
175 - Dimensional MetrologyHy D. Tran, PhD, PESandia National Laboratories(505) 844-5417
175 - Dimensional MetrologyJim SalsburyMitutoyo America Corporation(630) 723-3619