2013 Technical Program

The NCSLI Technical Program for 2013 has something for everyone. We will cover a broad spectrum of topics in the world of measurement science.
Here are some highlights to look for...
  • Plenary session on Tuesday, providing an update on the redefinition of the kilogram (and other base units), and what this will mean for calibration laboratories and their customers.
  • Panel sessions on Traceability, Selection of Calibration Points, the Future of Calibration Services, an Educators Forum, and Vibration Traceability.
  • New this year: Ask the Experts – as part of a session on Mass metrology. Your chance to pose questions to Mass Experts.
  • More technician level sessions than ever, covering Dimensional, Electrical, Mass, Force, Pressure and more.
  • More Healthcare Metrology – the Healthcare Metrology session has been so popular that we’ve added a second session.
  • We are also doing something new this year - our Sponsor Track Sessions.


Don’t worry. We’ll still have plenty of sessions on Laboratory Management, Automation, Proficiency Testing, Uncertainty, Risk Mitigation and Workplace Development. This year, there truly is something for everyone. See for yourself!

Monday, July 15 5/14/2013
11:00 am - 12:00 pm  
Session 1  
(1A)  Workplace Development Room: Ryman Studio MNO
Track: Learning and Development
Host: Beverly Garcia
Best Metrological Practices for Small and Medium Enterprises
Salvador Echeverria-Villagomez, Centro Nacional de Metrologia (CENAM)
Network for Innovation and Research in Metrology for the Automotive Industry (RIIMSA) of Mexico
Flora Mercader, Universidad Politecnica de Santa Rosa Jauregui
(1B)  Proficiency Testing I Room: Ryman Studio PQR
Track: Management/Quality
Host: Mike Cadenhead
How to Use Risk Evaluation to Develop a Proficiency Testing Participation Plan
Paochu Kao, Taiwan accreditation foundation
How to Achieve a 0.01 µV/V Deviation on Your 10 Vdc Proficiency Test Without Using a Josephson Array
Gary Bennett, National Instruments Corporation
(1C)  Electrical - Resistance Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: William Miller
Use of Dual Source Technology and a High Resolution Electrometer to Measure High Value Resistance in a 17025 Environment
Duane Brown, Measurements International Ltd.
The Journey from 12 906.403 5 Ohms Through 19 Orders of Magnitude
Kai Wendler, NRC Measurement Science and Standards
(1D)  Dimensional - Thread Gage Metrology Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Rob Parchinski
Advances in Vision Systems will Enable Significant Improvements in Thread Metrology
Steve Pirnat, Quest Metrology
Comparison of Traditional and Emerging Technology for the Calibration of Thread Plug Gage Pitch Diameter
Henry Alexander, Perry Johnson Laboratory Accreditation, Inc.
(1E) Precision Environments
Track: Sponsor Track Room: Ryman Studio L
A brief overview of Precision Environments history and structure will be given. The bulk of the presentation will be Precision Environments technical approach to metrology laboratories design and build. The technical approach includes interpretation of specifications, design concepts and testing of laboratories. We will show how NCSLI RP-16 is implemented in Precision Environments approach to metrology laboratories design and build.
Monday, July 15  
 2:30 pm -  4:00 pm  
Session 2  
(2A)  Healthcare Metrology I Room: Ryman Studio MNO
Track: Learning and Development
Host: Marcus McNeely
Biometrology: Measurement Science for Life
Roberto Benitez Chavez, Corporacion BH, S.C.
Out of Tolerance Reporting - A Ticking Quality Time Bomb
Walter Nowocin, Medtronic, Inc.
How to Educate Testing and Medical Laboratories Together with Accredited Calibration Laboratories
I-Jhen Lin, Taiwan Accreditation Foundation
(2B)  Proficiency Testing II Room: Ryman Studio PQR
Track: Management/Quality
Host: Marlene Moore
Result Summary of Interlaboratory Comparison of LED Bulb in Taiwan
Cheng-Yen Fang, Industrial Technology Research Institute (ITRI)
Inter-laboratory Comparison Study Using Modular Instrumentation
Dimaries Nieves Rivera, National Instruments Corporation
Multi-Parameter Electrical Inter-Laboratory Comparison Results, ILC Thoughts & Experiences, and RP-15
Leif  King, B&W Y-12, LLC
(2C)  Electrical I Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host:  Cory Peters
New 10V PJVS and its Application for NCSLI Josephson Voltage Standard Interlaboratory Comparison 2014
Yi-hua Tang, NIST
Coupling Quantum AC Voltage Standards and New Multijunction Thermal Converters to Improve the NIST ACDC-Calibration Services 
Thomas E. Lipe, NIST
Army Quantum Metrology Initiative
John M. Ball, JBC-Alabama
(2D)  Mass: Concepts Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host:  Barbara Belzer
The Nitty-Gritty of Uncertainty Calculations in Mass Calibration
Patrick J. Abbott, NIST
Investigation on Digital Control Concepts for Dynamic Applications of Electromagnetic Force Compensated  Balances
Hanna Weis, TU Ilmenau
Mass Calibration with Robotic Mass Comparators
Mark Kliebenschaedel, Mettler Toledo
(2E) Fluke Calibration
Track: Sponsor Track Room: Ryman Studio L
Fluke Calibration is a leader in precision calibration instrumentation and software for electrical, temperature, pressure, flow, and RF measurements. Products from Fluke Calibration are used in calibration facilities around the world, including National Metrology Institutes, that demand the highest performance and reliability, backed by world-class metrology and uncompromising support.
Tuesday, July 16  
 8:30 am - 10:00 am  
Session 3  
(3A)  Plenary: The New SI Room: Ryman Studio MNO
Track: Learning and Development
Host: Alan Steele
How to Weigh Everything from Atoms to Apples Using the Revised SI
Jon R. Pratt, NIST
Towards a Final NRC Value for the Planck Constant
Dave Inglis, National Research Council of Canada
Mass Traceability in Vacuum towards Redefinition of the Kilogram
Richard Green, National Research Council of Canada
(3B)  Laboratory Management: Automation and Software Room: Ryman Studio PQR
Track: Management/Quality
Host: Keith Bennett
Calibration and Specification Considerations When Using Modular Instrumentation
Michael Dobbert, Agilent Technologies
The Use of Hardware Abstraction Layers in Automated Calibration Systems
Rishee Bhatt, National Instruments Corporation
Hosted Calibration Management Systems
Thomas Pessa, Exelon PowerLabs
(3C)  Dimensional Potpourri Room: Ryman Ballroom AD
Track: Metrology Concepts - Theory
Host: Malcolm Smith
Calibration of Coordinate Measuring Machines Meeting the Requirements of ISO 10360-2:2009 at the Standards and Calibration Laboratory
Lee Dennis, Standards and Calibration Laboratory, ITC, The Government of Hong Kong SAR
Important Broad-based Metrology Concepts in the Revised U.S. Micrometer Standard
Jim Salsbury, Mitutoyo America Corporation
Calibration of Laser Trackers
Jose Pires, Trescal
(3E) The Boeing Company
Track: Sponsor Track Room: Ryman Studio L
Tuesday, July 16  
11:00 am - 12:00 pm  
Session 4  
(4A)  Panel: Educator's Forum Room: Ryman Studio MNO
Track: Learning and Development
Host: Georgia Harris
This is a session to share ideas with and for metrology educators. Educators will share information about their programs, gather input and creative ideas from other educators, and gather input from industry and government participants about what new students need in the workplace. 
(4B)  Laboratory Quality Room: Ryman Studio PQR
Track: Management/Quality
Host:  Pamela Wright
A Simple Approach to Applying LEAN in the Laboratory
Dean S. Williams, Duke Energy
Using Agile and Scrum to Improve Deployment Time of Software Solutions when Hardware and Regulatory Dependencies are Involved
Logan  Kunitz, National Instruments Corporation
(4C)  Electrical II Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Cory Peters
Transition Time Measurement with an Oscilloscope of Comparable Performance: What Are the Correct Results and Associated Uncertainties 
Jian Liu, Ph.D., Agilent Technologies
Updated Evaluation of Calibration Test Point Selection for Fluke 57XX products
Jeff Gust, Fluke Calibration
(4D)  Panel: Paths to Dynamic Vibration Traceability at High, Medium and Low Frequencies Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Eric Seller
Management at NIST sent letter on November 16, 2012 soliciting input on the intent to withdraw from vibration calibration services with any remaining work completed no later than September 30, 2013.  Based on the collected input, NIST decided against terminating the calibration services as indicated in a letter dated April 26, 2013.
Although NIST will continue offering dynamic vibration calibration services, this situation has brought up many interesting questions on achieving traceability. This panel discussion will discuss the various avenues available for achieving traceability to the SI.
(4E) Mensor Corporation
Track:  Sponsor Track Room: Ryman Studio L
Applications and demonstration of the Mensor CPC8000 High End Pressure Controller and the CPA8001 Air Data Test Set (ADTS): The CPC 8000 calibrates pressure transmitter, transducers, field calibrators, gauges and pressure sensors of all kinds; The CPA8001 calibrates altitude / vertical air speed / airspeed and air data computers.
Tuesday, July 16  
 2:30 pm -  4:00 pm  
Session 5  
(5A)  Healthcare Metrology II Room: Ryman Studio MNO
Track: Learning and Development
Host: Doug Cooper
Best Lessons Learned from FDA Warning Letters
Walter Nowocin, Medtronic, Inc.
SCARs, CARs, NCRs, CAPAs, and Complaints – What’s it all mean?
Harry Spinks, Cummins Power Generation
An Overview of the NCSLI 151 Healthcare Metrology Committee
Marcus McNeely, Blue Mountain Quality Resources, Inc.
(5B)  Panel: Calibration and Measurement Services 2020 Room: Ryman Studio PQR
Track: Management/Quality
Host: Kamal Hossain
It is extremely difficult to predict the future, and yet, in order to be prepared for future challenges, it is imperative to plan ahead. There has been no time in history where change has occurred so quickly and on so many fronts as is happening now. How are calibration service providers planning for the future? What measurement requirements will their customers demand in order to remain competitive?  This panel will discuss what to expect from and how to plan for the changes to measurement service laboratories and their customers in the year 2020 and beyond. A broad spectrum of views will be presented, to include instrument manufacturers, large and small third party calibration laboratories and the biomedical sector. 
(5C)  Mass - Uncertainties Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Georgia Harris
Determination of the Conventional Mass Value of a Test Weight Using Bayesian Theory and a Monte Carlo Method
Francisco García, CESMEC Ltda.
Wear Behavior of Mass Standards
Ilko Rahneberg, Ilmenau University of Technology
NIST Dynamic Force Calibration Facility
Akobuije Chijioke, NIST
(5D)  Panel: Calibration Point Selection Practices Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Joseph Petersen
Calibration point selection is important for assuring comprehensive calibrations and reliable measurements.  However existing quality standards do not directly address this topic.  The intent of this panel is to identify quality issues and gaps associated with selection of calibration points.  Panelists will share their perspectives on the topic and time will be devoted to soliciting expertise and opinions from the audience.  Audience comments on concerns, issues and best practices will be captured for publication. 

The objective of this panel is to garner interest on the topic of point selection with a view towards identifying and establishing best practices.  Please come to this session to ask questions, raise issues and share your best practices. We look forward to seeing you there!
(5E) Agilent Technologies
Track: Sponsor Track Room: Ryman Studio L
Accurate Noise measurements to 50 GHz using a PNA-X Network Analyzer.
New calibration techniques allow a high performance network analyzer to make fast and very accurate noise measurements across a wide swept frequency range.  Join Mike Dobbert, Agilent measurement specialist, as he discusses an overview of noise measurements, and provides a live demonstration of the new noise measurement application Agilent uses to calibrate wide frequency noise sources.
Wednesday, July 17  
8:30 am - 10:00 AM  
Session 6  
(6A)  Personnel Development Room: Ryman Studio MNO
Track: Learning and Development
Host:  Vernon Alt
Industrial Metrology Engineering: Educational Strategy to Fullfill the Needs of Industry and Society
Flora  Mercader, Universidad Politecnica de Santa Rosa Jauregui
Developing an Integrated Curriculum in Metrology for a Mechanical Engineering Technology Program
Joe Fuehne, Purdue University College of Technology
Selecting the Right Person for the Right Job
Steven  Stahley, Cummins, Inc.
(6B)  Panel: Traceability without Uncertainty? Room: Ryman Studio PQR
Track: Management/Quality
Host: Charles Ehrlich
Metrological Traceability is defined in the International Vocabulary of Metrology – Basic and general concepts and Associated Terms (VIM), 3rd Edition, as “property of a measurement result whereby the result can be related to a reference through a documented unbroken chain of calibrations, each contributing to the measurement uncertainty.” Since a measurement result itself is generally expressed as a single measured value and a measurement uncertainty, it is clear that the concept of metrological traceability is strongly dependent on the concept of measurement uncertainty. However, historically, the concept of traceability has been used in conjunction with measurement hierarchy schemes where measurement uncertainty has not been part of the scheme, at least not explicitly. For example, test accuracy ratios (TARS) along with control charts have been used very successfully in numerous measurement systems/schemes that invoke the principle of traceability, without measurement uncertainty being explicitly considered. This Panel will examine issues surrounding how metrological traceability can still be obtained, in a cost-effective manner, for such legacy measurement systems.
(6C)  Electrical - Theory Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Jay Klevens
Determining the Uncertainty of Frequency Measurements Referenced to GPS Disciplined Oscillators
Michael Lombardi, NIST
Development of Precision High to Ultra High DC Current Capabilities
Richard Timmons, Guildline Instruments, Ltd.
A New Automatic Flow Calorimeter for Measurement of 100 Watts at 1 GHz
Andy Brush, Tegam, Inc.
(6D)  Mass Standards & "Ask the Experts" Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host:  Anthony Reed
GWP - The Weighing Standard: Why We Should Challenge the Established Way We Calibrate and Test 
Klaus Fritsch, Mettler-Toledo AG
ASTM E617 “Standard Specifications for Laboratory Weights and Precision Mass Standards” Revision Impacts on Metrology, Accreditation, Legal Applications, and Research
Mark  Ruefenacht, Heusser Neweigh
In the last thirty minutes of this session, a panel of mass experts will answer questions from the audience related to mass measurements, uncertainties, redefinition of the kilogram, stability, handling and other related topics.
(6E) Trescal / Dynamic Technology Inc.
Track:  Sponsor Track Room: Ryman Studio L
Wednesday, July 17  
11:00 am - 12:00 pm  
Session 7  
(7A)  Metrology Skills and Knowledge Transfer Room: Ryman Studio MNO
Track: Learning and Development
Host: Paul Packebush
Storytelling as a Knowledge Management Tool in Metrology
Francisco Rodríguez Silva, Instituto Tecnológico de Celaya
Developing Metrology Skills
Steven Stahley, Cummins, Inc.
(7B)  Traceability Room: Ryman Studio PQR
Track: Management/Quality
Host: Chuck Ehrlich
The NIST Quality System for Measurement Services: A Gaze at its Past Decade and a Look towards its Future
Sally S. Bruce, National Voluntary Laboratory Accreditation Program (NVLAP)
Traceability – Impacts of an Evolving Concept
Kenneth  Mathews, NASA Kennedy Space Center
(7C)  Pressure Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Tim Osborne
The Uncertainty Analysis of Fluke Calibration Fused-Quartz Bourdon Tube Pressure Products
Joshua Biggar, Fluke Calibration
Development of an Optically-Based Primary Pressure Standard
Jay Hendricks, NIST
(7D)  Temperature Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Mike Coleman
Fully Automated Thermometer Calibration System at the Hong Kong Standards and Calibration Laboratory 
Chi Pui Cheung, Innovation and Technology Commission
A Proposal to Update the International Temperature Scale
Alan Steele, National Research Council of Canada
(7E) American Association for Laboratory Accreditation (A2LA)
Track:  Sponsor Track Room: Ryman Studio L
The presentation will include a description of our ISO/IEC 17025 Calibration Laboratory, ISO/IEC 17043 Proficiency Testing Provider, and ISO Guide 34 Reference Material Producer accreditation programs.  It will also include a description of our current training offerings and the benefits of pursuing accreditation. 
Wednesday, July 17  
 2:30 pm -  4:00 pm  
Session 8  
(8A)  Metrology Potourri Room: Ryman Studio MNO
Track: Learning and Development
Host: Georgette MacDonald
Software for Implementation of JCGM 106
Chi Pui Cheung, Innovation and Technology Commission
Non Conformities Analysis According to ISO/IEC 17025 in Brasil
Morgana Pizzolato, Universidade Federal de Santa Maria
Further Interpretation Study on the Term of Reference in VIM 3
Lung-Hen Chow, Industrial Technology Research Institute (ITRI)
(8B)  Risk Mitigation Room: Ryman Studio PQR
Track: Management/Quality
Host: Jim Smith
Producing Valid Results (Risk Mitigation and Measurement Assurance)
Philip  Mistretta, Transcat, Inc.
Process Accuracy vs Process Uncertainty (Risk Mitigation: Calibration and the Customer’s Process)
Jeremy Sims, Transcat, Inc.
Suitability of Instruments (Risk Mitigation and Measurement Assurance)
Howard Zion, Transcat, Inc.
(8C)  Dimensional I Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Roger Burton
Measuring Line Scales and Grid Plates on a Non-Vision CMM equipped with a White Light Confocal Probe
John Horwell, Hexagon Metrology, Inc.
Calibration of Sinusoid Reference Standards Using a Coherence Scanning Interferometer
Hy D. Tran, PhD, PE, Sandia National Laboratories
Picometer Metrology for Precise Measurement of Refractive Index, Pressure, and Temperature
Jack Stone, NIST
(8D)  New Challenges/Developments Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Michael Duncan
Analytical Evaluation of Response Characteristics of Temperature and Pressure Measurement Systems for Gas Turbine Engines
Ali A. Jalalzadeh-Azar, UTC Pratt & Whitney
Best Practices for Pipette Calibration Uncertainty Budgets and CMC Determination
George Rodrigues, Artel USA, Inc.
Low Frequency Accelerometer Calibration Challenges and Improvements
Eric Seller, The Modal Shop
(8E)
Track:  Sponsor Track Room: Ryman Studio L
Thursday, July 18  
 8:30 am - 10:00 am  
Session 9  
(9B)  Measurement Evaluation Room: Ryman Studio PQR
Track: Management/Quality
Host: Walter Nowocin
Study of Intraclass Correlation Coefficient Method in a Measurement System
Ignacio Ruiz-Guerrero, Instituto Tecnológico de Celaya
Comparison of Evaluation Criteria in the Use of a Measurement System Based on Regression with Gauge R&R Study
Jonathan Cortez-Rincon, Instituto Tecnologico de Celaya
Non-Symmetrical Consumer Risk
Ricardo A. Nicholas, The Boeing Company
(9C)  Uncertainty Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Jeff Gust
Simplified Methods for Calculating Uncertainties for Routine Calibrations
David Deaver, David Deaver Metrology
Uncertainty of Calibration of Instruments, a Simple Example in Dimensional Metrology
Ted  Doiron, NIST
A Closed-Form Solution for Quadratic Distribution Uncertainty from Containment Limits and Probability
Mark Kuster, Pantex Metrology
(9D)  Dimensional II Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Hy Tran
Measuring Long Gauge Blocks Using a Coordinate Measuring Machine
John Stoup, NIST
Interim Testing Strategies for Coordinate Measuring Machines
Edward Morse, University of North Carolina at Charlotte
Laboratory Lighting and Temperature Effects on Dimensional Metrology Calibrations
Rick Mertes, Sandia National Laboratories
(9E)
Track:  Sponsor Track Room: Ryman Studio L
Thursday, July 18  
11:00 am - 12:00 pm  
Session 10  
(10B)  Electrical Potpourri Room: Ryman Studio PQR
Track: Metrology Skills - Technician/Bench Applications
Host:  Dave Deaver
Temperature & Humidity Environmental Controls in a Primary Standards Laboratory
Ivars Ikstrums, Fluke Calibration
Calibration of Rogowski Coils at High Pulsed Currents
Branislav Djokic, National Research Council of Canada
(10C)  Dimensional III Automation and Integration Room: Ryman Ballroom CF
Track: Metrology Concepts - Theory
Host: Robert Sawyer
Automation Design of Multiple Intellegent Integration
Nghiem Nguyen, Raytheon
Creating a Calibration Measurement Monitoring System for Many Ever-changing Complex Instruments
John Wilson, Agilent Technologies
(10D)  Chemical Metrology Room: Ryman Ballroom AD
Track: Metrology Skills - Technician/Bench Applications
Host: Jun Bautista
Direct Traceability for Ultra-pure Water Conductivity
Hans  Jensen, Danish Fundamental Metrology (DFM)
MESURA-CENAMEP Project for Establishing a Chemical Metrology Infrastructure in Panama for the Sectors Health, Food, Water, and the Environment
Salvador Echeverria-Villagomez, Centro Nacional de Metrologia (CENAM)
(10E)
Track:  Sponsor Track Room: Ryman Studio L