Conference Best Paper Award

One of the most important events of the NCSLI conference is the awarding of the Best Paper awards, and the quality of the conference is anchored on the strength of the technical program. Awards are given for the highest scoring paper/presentation for each of the tracks for that year, with the "Dr. Allen V. Astin" Best Paper award going to the highest scoring paper overall.

2017 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Calibration of the Frame Rate of High Speed Digital Video Recorders by Stationary Counting Method: Application of the Stroboscopic Effect

Dr. Terry Hau Wah Lai, The Government of the Hong Kong, Standards and Calibration Laboratory;  Michael W. K. Chow, The Government of the Hong Kong, Standards and Calibration Laboratory; Henry C. K. Ma, The Government of the Hong Kong, Standards and Calibration Laboratory

From Counting Electrons to Calibrating Ammeters: Improved Methodologies for Traceable Measurements of Small Electric Currents
Dr. Stephen Giblin, National Physical Laboratory (NPL); Jordan Tompkins, National Physical Laboratory (NPL)

Reducing Measurement Uncertainty Using a Smoothing Spline
Michael Dobbert, Keysight Technologies

Best Lessons Learned from FDA Warning Letters 2017
Walter Nowocin, Medtronic, PLC

2016 Best Paper Awards


The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Characterization of The NIST Magnetic Suspension Mass Comparator Apparatus And Facility
Edward Mulhern, Corey Stambaugh, National Institute of Standards and Technology (NIST)

Influence of Adapters on AC-DC Difference Measurements
Stefan Cular, Thomas E. Lipe, National Institute of Standards and Technology (NIST)

Calibration of Electro-Cardio Graph Simulators
Steven Yang, Aaron Y.K. Yan, Chris M.N. Ng, The Government of the Hong Kong Special Administrative Region Standards and Calibration Laboratory

Calibration of Optical Fiber Time Domain Reflectometers in Accordance with IEC 61749-1:2009
Samuel C.K. Ko, Aaron Y.K. Yan, The Government of the Hong Kong Special Administrative Region Standards and Calibration Laboratory

Understanding the Test Measurand and the Profound Impact on Calibration, Verification, and Uncertainty
James G. Salsbury PhD, Mitutoyo America

2015 Best Paper Awards
The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Instrument Adjustment Policies
Paul Reese, Baxter Healthcare Corporation

Ramifications of Proposed Changes to Decision Rules in 3 Standards within ISO and ASME
Craig Shakarji, National Institute of Standards and Technology (NIST)

The International Temperature Scale: Past, Present, and Future
Kenneth Hill and Alan Steele, National Research Council of Canada (NRC)

Insight into the APLAC Member Survey on Report Credibility
Nigel Jou and Wanji Yang, APLAC, Taiwan Accreditation Foundation

Calibration of Defibrillator Analyzers at the HKSARG Standards and Calibration Laboratory
Steven Yang, Standards & Calibration Laboratory, Hong Kong

2014 Best Paper Awards
The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Metrology Concepts / Theory
Electrical Units in the New SI: Saying Goodbye to the 1990 Values
Dr. Martin Milton, Bureau International des Poids et Mesures (BIPM)

Management / Development
Metrology for the Automotive Industry in Mexico
Dr. Salvador Echeverria-Villagomez, Centro Nacional de Metrologia (CENAM)

Metrology Skills – Technician/Bench Applications
Estimating Thermal Effects for Granite Surface Plate Calibration
Gordon Skattum, QE Solutions

Poster Presentation
Improved Performance, Remote Realization and Accessibility of the SIM Time Scale
Mauricio Lopez, Centro Nacional de Metrologia (CENAM)

2013 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Determining the Uncertainty of Frequency Measurements Referenced to GPS Disciplined Oscillators

Michael Lombardi, National Institute of Standards and Technology (NIST)

Metrology Skills – Technician/Bench Applications
Direct Traceability for Ultra-Pure Water Conductivity
Hans Jensen, Danish Fundamental Metrology (DFM) 

Management and Quality
A Simple Approach to Applying LEAN in the Laboratory
Dean Williams, Duke Energy

Learning and Development
Developing an Integrated Curriculum in Metrology for a Mechanical Engineering Technology Program
Joe Fuehne, Purdue University College of Technology

Metrology Concepts - Theory
Determining the Uncertainty of Frequency Measurements Referenced to GPS Disciplined Oscillators
Michael Lombardi, National Institute of Standards and Technology (NIST)

2012 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper
Developing an Educational Outreach Kit based on Dimensional Metrology
Dr. Hy Tran, Sandia National Laboratories

Metrology Skills – Technician/Bench Apps
GWP: The Science-Based Global Standard for Efficient Lifecycle Management of Weighing Systems
Klaus Fritsch, Mettler-Toledo AG 

Management / Quality
Calibration Point Selection - Who Makes the Call?
Joseph Petersen, Abbott Laboratories 

Global Perspectives
Building Global Calibration Services Through Partnerships
Dave, Skinner, National Instruments 

Metrology Concepts - Theory
A New Method for Measuring RF and Microwave Receiver Linearity
Michael Dobbert, Agilent Technologies 

Metrology Skills – Technician/Bench Apps
Developing an Educational Outreach Kit based on Dimensional Metrology
Dr. Hy Tran, Sandia National Laboratories

2011 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper

Revisiting Mismatch Uncertainty with the Rayleigh Distribution
Michael Dobbert, Agilent

Learning and Development
Metrology Ambassadors – Where are we now?
Elizabeth Gentry, National Institute of Standards and Technology (NIST)

Management and Quality
Revisiting Mismatch Uncertainty with the Rayleigh Distribution
Michael Dobbert, Agilent

Metrology Skills – Technician/Bench Applications
The (Continuing) Evolution of Articulated Arm CMM Testing

Edward Morse, UNC Charlotte

Global Perspectives 
Dissemination of a New Kilogram Definition through Magnetic Levitation
Patrick Abbott, National Institute of Standards and Technology (NIST)

Metrology
Concepts - Theory
A Method for Verifying Traceability in Effective Area for High Pressure Oil Piston-Cylinders
Michael Bair, Fluke Calibration

2010 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper

Setting and Using Product Specifications – An Overview
Michael Dobbert, Agilent Technologies 

Physical and Dimensional
Accounting for the Impact of Thermal Instability in the Fluid Comprising the Connecting Volume of a Piston Displacement Type Volumetric Flow Rate Standard
Jeremy Latsko, Air Force Metrology and Calibration Program (AFMETCAL) 

Management and Quality
Implementing A2LA's New Budget Requirements for Electrical and RF Uncertainties in Fluke MET/CAL Procedures
Michael Schwartz, Cal Lab Solutions 

Learning and Development
Setting and Using Product Specifications – An Overview
Michael Dobbert, Agilent Technologies

International

The NRC Watt Balance Project
Dr. Dave Inglis, National Research Council (NRC) Canada 

Electrical and Chemical 
Characterization of the Power Coefficient of AC and DC Current Shunts

David Deaver, Fluke (retired)

2009 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper

Automating Data Acquisition on a Mechanical Equal Arm Balance Used in Large Mass Calibrations
Kevin Chesnutwood, National Institute of Standards and Technology (NIST)

International
International Comparison of a AC-DC Current Transfer Standards at Frequencies Up to 1 MHz

Dr. Ilya Budovsky, National Measurement Institute, Australia

Learning and Development
Measure for Measure- How an English Major Became an Intern in a Metrology Lab

Rebecca Shelton, US Army Primary Standards Laboratory

Physical/Dimensional
Automating Data Acquisition on a Mechanical Equal Arm Balance Used in Large Mass Calibrations
Kevin Chesnutwood, NIST

Management
and Analytical
An Examination of Measurement Decision Risk and Other Measurement Quality Metrics
Dr. Howard Castrup, Integrated Sciences Group

Technical

A 10 Volt “Turn Key” Programmable Voltage Standard for DC and Stepwise Approximated AC Voltage Applications
Charles Burroughs, National Institute of Standards and Technology (NIST)

2008 Best Paper Awards

The "Dr. Allen V. Astin" Award: Overall Best Conference Paper

Sensitivity Drift Behavior Precision Mass Comparator for Weighing Prototype
Shih Mean Lee, National Metrology Centre  A*Star (NMC) 

Mass Metrology

Sensitivity Drift Behavior Precision Mass Comparator for Weighing Prototype
Shih Mean Lee, National Metrology Centre  A*Star (NMC)

International
Uncertainties Related to a Calibration of Rogowski Coils

Branislav Djokic, National Research Council of Canada

Learning and Development
A Measurement Standard for Evaluating Metrology Positions

Danny Newcombe,  Maine Department of Agriculture

Management and Analytica
A Guard Band Strategy for Managing False Accept Risk

Michael Dobbert, Agilent Technologies

Technical
The Design and Implementation of a Fully Automated Cross Float System for the Comparison of Piston Gauges in Both Gauge and Absolute Measurement Modes

Michael Bair, DH Instruments a Fluke Company