Conference Best Paper Award

One of the most important events of the NCSLI conference is the awarding of the Best Paper awards, and the quality of the conference is anchored on the strength of the technical program. Awards are given for the highest scoring paper/presentation for each of the tracks for that year, with the "Dr. Allen V. Astin" Best Paper award going to the highest scoring paper overall.

2012 Best Paper Awards

•The "Dr. Allen V. Astin" Award - Learning and Development

“Developing an Educational Outreach Kit based on Dimensional Metrology”
Dr. Hy Tran, Sandia National Laboratories

•Metrology Skills – Technician/Bench Apps

        “GWP: The Science-Based Global Standard for Efficient Lifecycle
        Management of Weighing Systems”
        Klaus Fritsch, Mettler-Toledo AG

•Management / Quality

“Calibration Point Selection - Who Makes the Call?”
Joseph Petersen, Abbott Laboratories

•Global Perspectives

“Building Global Calibration Services Through Partnerships”
Dave, Skinner, National Instruments

•Metrology Concepts - Theory

“A New Method for Measuring RF and Microwave Receiver Linearity”
Michael Dobbert, Agilent Technologies

2010 Best Paper Awards

•The "Dr. Allen V. Astin" Award - Learning and Development

        “Setting and Using Product Specifications – An Overview”
         Michael Dobbert, Agilent Technologies

•Physical and Dimensional

        “Accounting for the Impact of Thermal Instability in the Fluid Comprising the
        Connecting Volume of a Piston Displacement Type Volumetric Flow
        Rate Standard”
        Jeremy Latsko, Air Force Metrology and Calibration Program (AFMETCAL)

•Management and Quality

        “Implementing A2LA's New Budget Requirements for Electrical and
        RF Uncertainties in Fluke MET/CAL Procedures”
        Michael Schwartz, Cal Lab Solutions

•International

        “The NRC Watt Balance Project”
         Dr. Dave Inglis, National Research Council (NRC) Canada

•Electrical and Chemical

        “Characterization of the Power Coefficient of AC and DC Current Shunts”
         David Deaver, Fluke (retired)

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2008 Best Paper Awards

•The "Dr. Allen V. Astin" Award - Mass Metrology

        "Sensitivity Drift Behavior Precision Mass Comparator for Weighing Prototype”
        Shih Mean Lee, National Metrology Center

•International

        "Uncertainties Related to a Calibration of Rogowski Coils”
        Branislav Djokic, National Research Council of Canada

•Learning and Development

        "A Measurement Standard for Evaluating Metrology Positions”
        Danny Newcombe, Maine Department of Agriculture

•Management and Analytica

        "A Guard Band Strategy for Managing False Accept Risk”
        Michael Dobbert, Agilent Technologies

•Technical

        "The Design and Implementation of a Fully Automated Cross Float
        System for the Comparison of Piston Gauges in Both Gauge and
        Absolute Measurement Modes”
        Michael Bair, DH Instruments a Fluke Company

2011 Best Paper Awards

•The "Dr. Allen V. Astin" Award - Management/Quality

“Revisiting Mismatch Uncertainty with the Rayleigh Distribution”
Michael Dobbert, Agilent

•Learning and Development

“Metrology Ambassadors – Where are we now?
Elizabeth Gentry, NIST

•Metrology Skills – Technician/Bench Applications

“The (Continuing) Evolution of Articulated Arm CMM Testing”
Edward Morse, UNC Charlotte

•Global Perspectives

        “Dissemination of a New Kilogram Definition through Magnetic Levitation”
        Patrick Abbott, NIST

•Metrology Concepts - Theory

        “A Method for Verifying Traceability in Effective Area for High Pressure
         Oil Piston-Cylinders”
         Michael Bair, Fluke Calibration

2009 Best Paper Awards

•The "Dr. Allen V. Astin" Award - Physical/Dimensional

        "Automating Data Acquisition on a Mechanical Equal Arm Balance Used in
        Large Mass Calibrations"
        Kevin Chesnutwood, NIST

•International

        "International Comparison of a AC-DC Current Transfer Standards at
        Frequencies Up to 1 MHz"
        Dr. Ilya Budovsky

•Learning and Development

        "Measure for Measure- How an English Major Became an Intern in
        a Metrology Lab"
        Rebecca Shelton, US Army Primary Standards Laboratory

•Management and Analytical

        "An Examination of Measurement Decision Risk and Other
        Measurement Quality Metrics"
        Dr. Howard Castrup, Integrated Sciences Group

•Technical

        "A 10 Volt “Turn Key” Programmable Voltage Standard for DC and Stepwise
        Approximated AC Voltage Applications"
        Charles Burroughs, NIST