NCSLI New Mexico Section

Meeting Date: Thursday, March 19, 2020

Meeting Overview: The Albuquerque NCSL International Section provides metrology related training, information and discussion. The featured topic will be on "AC-DC Difference: Basic Principles." Our goal is to promote metrology, calibration, and testing throughout the region. Come and meet other metrology, calibration, and testing professionals with plenty of time for networking.

Contact Information:
Ricky Sandoval
Edward O’Brien

Meeting Time:
10:00 AM – 12:30 PM

Cost to attend meeting: Complimentary

Meeting Location:
TEVET - Albuquerque Corporate Office
1314 Madeira Dr. SE 87108 Albuquerque, NM 87108

Directions Freeway Directions: Take I-25 to Gibson Blvd and proceed eastbound until reaching Madeira Drive. or Take I-40 to San Mateo Blvd and proceed southbound until reaching Eastern Ave SE and then proceeding eastbound until reaching Madeira Drive. Proceed southbound on Madeira Drive until reaching 1314 Madeira Drive SE.

Sponsor: TEVET

Refreshments and snacks will be provided

Topic: AC-DC Difference: Basic Principles
Speaker: Stefan Cular, National Institute of Standards and Technology (NIST)
Abstract: AC-DC difference serves as the fundamental link to the SI for ac voltage, current and power. But where does this quantity come from and how is it applied? In this presentation the underlying principles of the measurements will be presented from basic device physics and determination of the ac-dc difference to scaling the value to the far reaches of the standard calibration service measurement space roughly defined as 1 mV to 1 kV and 1 mA to 100 A over a frequency range of 10 Hz to 100 MHz. The number of ac-dc difference scaling steps from primary standards was reduced over the last decade using thin film multijunction thermal converters, which subsequently reduced the uncertainty provided to customers. Although this rudimentary knowledge is widely published, and there is significant demand for the calibration service, there are only a handful of labs around the world that have independent realization of the ac-dc difference, NIST being one of them.

Meeting Schedule:

9:45 am – 10:00 am Registration
10:00 am – 10:15 am Eddie & Ricky Introduction
10:15 am – 11:15 am Stefan Cular AC-DC Difference: Basic Principles
11:15 am – 12:30 pm Lunch Provided

Past Meetings and Events

Albuquerque Section Meeting, Monday June 4, 2018
The NCSL International Albuquerque Section held its summer meeting on June 4, 2018 at the Compa Industries/TEVET Albuquerque Corporate Office. The meeting lasted for approximately seven hours and had 25 attendees. The meeting was led by Dilip A. Shah of E = mc3 Solutions, who has over 40 years of industry experience in metrology, electronics,
instrumentation, measurement and computer applications of statistics in the Quality Assurance areas. The meeting host was Keysight Technologies, who provided both the meeting location and lunch for all attendees. Snacks and refreshments were provided throughout the meeting by the NCSL International Albuquerque Section leads.
Section Meeting Review (.PDF)

Albuquerque Section Meeting, Wednesday January 10, 2018
The NCSL International Albuquerque Section held its winter meeting on January 10, 2018 at the Juan Tabo Public Library. The meeting lasted for approximately two hours and had 22 attendees. One of our speakers, Joshua Stanford was not able to attend. His presentation titled, “Gage R&R Study on New LCR Measurement System Software,” will be moved to a future NCSLI Albuquerque Section meeting. The meeting began with an announcement of upcoming NCSLI events such as the upcoming Technical Exchange in February and the Workshop & Symposium held in late August. Attendees were then encouraged to become NCSLI members, if they were not already.
Section Meeting Review (.PDF)

Albuquerque Section Meeting, May 2014
The NCSLI Albuquerque Section Meeting was held on May 14, 2014 at the Albuquerque Marriott Hotel, following The Third Seminar on Surface Metrology for the Americas.
Section Meeting Review (.PDF)