Technical Program | Oral Sessions

Check for updates to the program!

SESSION 1
TUESDAY, AUGUST 27 | 10:30 AM - 11:30 AM

1A – Metrology in Motion |
Cost Effective Calibration of Temperature Loggers
Jan Laursen, Senior Metrologist, Novo Nordisk A/S
Course Description

Big Measurement Data
Steven Dwyer, Naval Surface Warfare Center (NSWC), Corona Division
Course Description

1B – Cutting Edge Metrology |
Misuse and Misconceptions of Physical Temperature Buffering
Michael Rusnack, VP Science and Engineering, AmericanPharma Technologies
Course Description

Electric Weapons and Other Futuristic Metrology Areas for Navy/DoD
Dr. Subrata Sanyal, Naval Surface Warfare Center (NSWC), Corona Division
Course Description

1C – Panel Presentation |
Bridging the Body of Knowledge to Local Membership
Moderator: James "Smitty" Smith, The Boeing Company
Panelists: Pending
Course Description Pending

1D – Electrical Measurements |
A Compact Table-Top Implementation of the Quantized Hall Resistance Standard
Dr. Alireza Panna, National Institute of Standards and Technology (NIST)
Course Description

Josephson Arbitrary Waveform Synthesizer as a Quantum Standard of Voltage and Current Harmonics
Dr. Dimitrios Georgakopoulos, Senior Research Scientist, National Measurement Institute Australia
Course Description

LL1 – Learning Lab | 10:30 AM – 12:00 PM |

Why a 4:1 TUR May Not Be Enough: The Importance of Analyzing the Probability of False Accept Risk
Instructors: Henry Zumbrun, Morehouse Instruments and Dilip Shah, E = mc3 Solutions
Course Description

LL2 – Learning Lab | 10:30 AM – 12:00 PM |
Establishing a Personal Mentoring Program for Technologists in the Test & Calibration Fields: Steps, Strides & Leaps
Instructor: James "Smitty" Smith, The Boeing Company
Course Description

LL3 – Learning Lab | 10:30 AM – 12:00 PM |
Angular Torque Instruments
Instructor: Lloyd Baker, General Motors, Instrument Knowledge Center
Course Description

SESSION 2
TUESDAY, AUGUST 27 | 1:00 PM - 2:00 PM

2A – Quality Systems and Management |
Measurement Quality Assurance of Metrology: The Criteria to Update the Control Chart
Chi-Hsuan Lin, Quality Assurance Engineer, Industrial Technology Research Institute (ITRI)
Course Description

Quality Blind Spot: Tolerancing Bias
Howard Zion, Director of Service Application Engineering, Transcat, Inc. 
Course Description


2B – Thermodynamic Measurements |
Suggested Methods for Evaluating and Controlling SPRT and PRT Drift
Michael Coleman, Corporate Temperature Metrologist, Fluke Calibration
Course Description

RTD Stability at 665C for 1.5 years
Ron Wilkes, Tayco Engineering, Inc. 
Course Description


2C – Panel Presentation |
Let's Figure out How to Implement Pass/Fail Decision Rules
Moderator: Bob Stern, Principal Metrologist, Emeritus, Keysight Technologies 
Panelists: Steve Marschke, Raytheon Company
Course Description

2D – Metrology in Motion |
NMI's for Industry
Jennifer Clarke, National Physical Laboratory (NPL)
Course Description

Measuring and Adjusting the Stiffness and Tilt Sensitivity of a Novel 2D Monolithic High Precision Electromagnetic Force Compensated Weighing Cell
Markus Pabst, Technische Universität Ilmenau, Germany
Course Description

SESSION 3
TUESDAY, AUGUST 27 | 2:30 PM - 3:30 PM

3A – Quality Systems and Management |
Analysis of Regulations Applied to Environmental Protection and Mechanisms for Its Implementation
Dr. Salvador Echeverria-Villagomez, CENAM, Mexico
Course Description

Pending Presentation

3B – Force/Torque Measurements |
Without the Right Adapters a Force Calibration Technician is Nothing Short of Being Called a Miracle Worker
Henry Zumbrun, Morehouse Instrument Company, Inc.
Course Description

Development of a Nanonewton Force Measurement Device
Oliver Dannberg, Technische Universität Ilmenau, Germany
Course Description

3C – Measurement Uncertainty |

It Is Time Measuring Instruments Report Measurement Uncertainty
Michael Dobbert, Keysight Technologies
Course Description


Pending Presentation


3D – Mechanical Measurements |
Acoustic Chamber Characterization
Edward O'Brien, Sandia National Laboratories
Course Description

NIST Vibration Calibrations of Accelerometers from 0.2 Hz to 20 kHz 
Dr. Richard Allen, Physicist, National Institute of Standards and Technology (NIST)
Course Description

SESSION 4
WEDNESDAY, AUGUST 28 | 10:30 AM - 11:30 AM

4A – Electrical Measurements |
Universally Deployable dc Josephson Voltage Standard
Dr. Alain Rüfenacht, PML Quantum Electronics and Photonics, National Institute of Standards and Technology (NIST)
Course Description

Using Special Methods to Reach the Requirements on Low Frequency ac Voltage Calibrations
Dr. Tsung-Ping Lee, National Space Organization, Taiwan
Course Description

4B – Thermodynamic Measurements |
An Adaptive Thermocouple Inhomogeneity Scanning System
Dr. Brenda Lam, Standards and Calibration Laboratory, The Government of Hong Kong, SAR 
Course Description

Treatment of Temperature Data for Comparison in Interlaboratory Comparisons
Frank Liebmann, Fluke Calibration
Course Description

4C – Measurement Uncertainty |
Calibration and Uncertainty – A Case Study Demonstrating the Application of ISO 14978
Dr. James Salsbury, General Manager, Corporate Metrology, Mitutoyo America Corporation 
Course Description

Understanding What Should and Should Not Be Included in Test Value Uncertainty
Dr. Craig Shakarji, National Institute of Standards and Technology (NIST) 
Course Description

LL4 – Learning Lab | 10:30 AM – 12:00 PM |
Test Equipment Acquisition Options – How to Get the Most for Your Time and Money
Instructor: Scott Wrinkle and Allen Todd, TRS-RenTelco
Course Description

LL5 – Learning Lab | 10:30 AM – 12:00 PM |
Hands-On Measuring Tool Training: Developing a Program for Local Craftsman, Technologists and Professionals
Instructors: Joseph Fuehne PhD, Director, Polytechnic Columbus; Steven Stahley, Cummins Inc.
Course Description

LL6 – Learning Lab | 10:30 AM – 12:00 PM |
Reviewing Supplier Provided Calibration Certificates: Training in a Standardized Process for Submittal and Evaluation for Acceptance
Instructor: Danae Powell, Energy Northwest
Course Description

SESSION 5
WEDNESDAY, AUGUST 28 | 1:00 PM - 2:00 PM

5A – Measurement Uncertainty |
A Surprising Link Between Measurement Decision Risk and Calibration Interval Analysis
Dennis Jackson, Naval Surface Warfare Center (NSWC), Corona Division
Course Description

Effect of Radio Frequency Signals on Resistive Measurements of Temperature
Frank Liebmann, Fluke Calibration
Course Description

5B – Pressure Measurements |
Zeroing an Absolute Pressure Transducer Techniques and Pitfalls
Robert Clayton, Mensor, LP
Course Description

Study on Improving the Measurement Uncertainty of Pressure On-Site Calibration
Chao-Yu Huang, National Chung-Shan Institute of Science and Technology, Taiwan
Course Description

5C – Panel Presentation |
Latest Trends on FDA Inspections Related to Calibration
Moderator: Walter Nowocin, Medtronic, PLC 
Panelists: Pending
Course Description Pending

5D – Dimensional Measurements |
Investigation of X-ray Computed Tomography for Dimensional Measurement
Dr. Shihua Wang, National Metrology Centre A*Star (NMC), Singapore
Course Description

A Proposal for Developing Competency-Based, Dimensional Certification
Joseph Fuehne PhD, Director and Associate Professor, Purdue Polytechnic Columbus
Course Description

SESSION 6
WEDNESDAY, AUGUST 28 | 2:30 PM - 3:30 PM

6A – Electrical Measurements |
Smart Power Supply Calibration System
Iraj Vasaeli, Metrology Specialist, NASA Jet Propulsion Laboratory (JPL) 
Course Description

Technology and Design Advancements in Transconductance Amplifier Laboratory Standards
Mark Evans, Senior Design Engineer, Guildline Instruments Limited
Course Description

6B – Quality Systems and Management |
Review of Methods for Communicating Uncertain Data with Graphs
Jennifer Clay, Vaisala
Course Description

The Role of Laboratories in the International Development of Accreditation
Jeff Gust, Chief Corporate Metrologist, Fluke Calibration
Course Description

6C – Panel Presentation: Metrology in Motion |
NIST on a Chip (NoaC): A Revolution in Metrology
Moderator: Barbara Goldstein, NIST 
Panelists: Barbara Goldstein, PML Headquarters, NIST; Dr. John Lehman, PML Quantum Electronics and Photonics, NIST; Dr. Raegan Johnson, Sandia National Laboratories;
Dr. Subrata Sanyal, Naval Surface Warfare Center (NSWC), Corona Division; Dr. Alain Rüfenacht, PML Quantum Electronics and Photonics, NIST
Course Description

6D – Metrology in Motion |
Strategic Monitoring Sensor Placement
John Masiello, Masy BioServices
Course Description

NRC TimeLink – Remote Clock: Very High Accuracy Traceable Time Dissemination to Remote Users
Andre Charbonneau,
National Research Council (NRC), Canada

SESSION 7
THURSDAY, AUGUST 29 | 10:30 AM - 12:00 PM

7A – Mechanical Measurements |
Design and Validation of a System for Aerostatic Mass Artifact Density Measurements
Edward Mulhern, National Institute of Standards and Technology (NIST)
Course Description

New Mass Calibration Automation Software at NIST
Patrick Abbott, Mass Metrologist, National Institute of Standards and Technology (NIST)
Course Description

7B – Metrology Education |
MESURA 4.0 A Methodology to Help Companies with Metrology 4.0 Towards Industry 4.0
Dr. Salvador Echeverria-Villagomez, CENAM, Mexico
Course Description

How to Determine Equipment Accuracy for Test Method Specs
Heather Wade, Heather Wade Group, LLC
Course Description

7C – Panel Presentation |
Quality Check: Calibration Laboratory Outgoing Quality Policies, Practices & Processes
Moderator: James "Smitty" Smith, The Boeing Company 
Panelists: Pending

Course Description

7D – Quality Systems and Management |
Management of Test and Measurement Equipment in line with ISO 10012: In Large Organization e.g. German Armed Forces, with the Perception to Ensure Calibration According to ISO 17025:2017 (in house/external)
Gerhard Mihm , Bundeswehr, Germany
Course Description

Exploiting Improvement Opportunities in Laboratory Activities
Jennifer Fleenor, Tektronix Inc.
Course Description

7E – Pharma/Medical |
Application of Training for Competence Practices for Cost-Effective pH Meter Calibration
Johan Schroll-Fleischer, Novo Nordisk A/S, Bagsvaerd, Denmark
Course Description

Managing Calibration Risk for Medical Devices
Harry Spinks, TechTrology LLC
Course Description

Application of a High-Resolution X-ray Computed Tomography for Measuring Defects in Glass Fiber
Shihua Wang, National Metrology Centre A*Star (NMC), Singapore
Course Description





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